Journal article 1173 views
A Comparison between a Fully-3D Real-Space Versus Coupled Mode-Space NEGF in the Study of Variability in Gate-All-Around Si Nanowire MOSFET
Antonio Martinez Muniz,
Antonio Martinez Muniz 
Swansea University Author:
Antonio Martinez Muniz
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DOI (Published version): 10.1109/sispad.2009.5290218
Abstract
A Comparison between a Fully-3D Real-Space Versus Coupled Mode-Space NEGF in the Study of Variability in Gate-All-Around Si Nanowire MOSFET
| Published: |
2009
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa10583 |
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| College: |
Faculty of Science and Engineering |
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