Journal article 1635 views
Study of surface roughness in extremely small Si nanowire MOSFETs using fully-3D NEGFs
Antonio Martinez Muniz,
Antonio Martinez Muniz
Swansea University Author: Antonio Martinez Muniz
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1109/sced.2009.4800460
Abstract
Study of surface roughness in extremely small Si nanowire MOSFETs using fully-3D NEGFs
| Published: |
2009
|
|---|---|
| URI: | https://cronfa.swan.ac.uk/Record/cronfa10574 |
| College: |
Faculty of Science and Engineering |
|---|