Journal article 1106 views
Study of surface roughness in extremely small Si nanowire MOSFETs using fully-3D NEGFs
Antonio Martinez Muniz,
Antonio Martinez Muniz 
Swansea University Author:
Antonio Martinez Muniz
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DOI (Published version): 10.1109/sced.2009.4800460
Abstract
Study of surface roughness in extremely small Si nanowire MOSFETs using fully-3D NEGFs
| Published: |
2009
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa10574 |
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| College: |
Faculty of Science and Engineering |
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