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Control of roughness at interfaces and the impact on charge mobility in all-polymer field-effect transistors

Shion Seng Chang, Ana B Rodríguez, Anthony Higgins Orcid Logo, Chuan Liu, Mark Geoghegan, Henning Sirringhaus, Fabrice Cousin, Robert M Dalgleish, Yvonne Deng

Soft Matter, Volume: 4, Issue: 11, Pages: 2220 - 2224

Swansea University Author: Anthony Higgins Orcid Logo

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DOI (Published version): 10.1039/b810278c

Published in: Soft Matter
ISSN: 1744-683X 1744-6848
Published: 2008
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URI: https://cronfa.swan.ac.uk/Record/cronfa5781
first_indexed 2013-07-23T11:53:43Z
last_indexed 2018-02-09T04:32:33Z
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spelling 2016-08-16T10:40:56.8352533 v2 5781 2013-09-03 Control of roughness at interfaces and the impact on charge mobility in all-polymer field-effect transistors 4db715667aa7bdc04e87b3ab696d206a 0000-0003-2804-8164 Anthony Higgins Anthony Higgins true false 2013-09-03 EAAS Journal Article Soft Matter 4 11 2220 2224 1744-683X 1744-6848 31 12 2008 2008-12-31 10.1039/b810278c This project was a collaboration with Prof H. Sirringhaus FRS (Physics, Cambridge) and was led by A. M. Higgins. This project involved structural studies in Swansea/central facilities (funded by STFC PI A. M. Higgins) and electronic device fabrication/characterisation in Cambridge. The work used a novel methodology to control interfacial roughness via solvent quality, and demonstrated the influence of roughness on charge mobility at a buried all-polymer semiconducting/dielectric interface within a field-effect transistor. COLLEGE NANME Engineering and Applied Sciences School COLLEGE CODE EAAS Swansea University 2016-08-16T10:40:56.8352533 2013-09-03T06:22:17.0000000 Faculty of Science and Engineering School of Engineering and Applied Sciences - Biomedical Engineering Shion Seng Chang 1 Ana B Rodríguez 2 Anthony Higgins 0000-0003-2804-8164 3 Chuan Liu 4 Mark Geoghegan 5 Henning Sirringhaus 6 Fabrice Cousin 7 Robert M Dalgleish 8 Yvonne Deng 9
title Control of roughness at interfaces and the impact on charge mobility in all-polymer field-effect transistors
spellingShingle Control of roughness at interfaces and the impact on charge mobility in all-polymer field-effect transistors
Anthony Higgins
title_short Control of roughness at interfaces and the impact on charge mobility in all-polymer field-effect transistors
title_full Control of roughness at interfaces and the impact on charge mobility in all-polymer field-effect transistors
title_fullStr Control of roughness at interfaces and the impact on charge mobility in all-polymer field-effect transistors
title_full_unstemmed Control of roughness at interfaces and the impact on charge mobility in all-polymer field-effect transistors
title_sort Control of roughness at interfaces and the impact on charge mobility in all-polymer field-effect transistors
author_id_str_mv 4db715667aa7bdc04e87b3ab696d206a
author_id_fullname_str_mv 4db715667aa7bdc04e87b3ab696d206a_***_Anthony Higgins
author Anthony Higgins
author2 Shion Seng Chang
Ana B Rodríguez
Anthony Higgins
Chuan Liu
Mark Geoghegan
Henning Sirringhaus
Fabrice Cousin
Robert M Dalgleish
Yvonne Deng
format Journal article
container_title Soft Matter
container_volume 4
container_issue 11
container_start_page 2220
publishDate 2008
institution Swansea University
issn 1744-683X
1744-6848
doi_str_mv 10.1039/b810278c
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Biomedical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Biomedical Engineering
document_store_str 0
active_str 0
published_date 2008-12-31T12:12:30Z
_version_ 1821407498484056064
score 11.048194

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