Higgins, A., Chang, S. S., Rodríguez, A. B., Liu, C., Geoghegan, M., Sirringhaus, H., . . . Deng, Y. (2008). Control of roughness at interfaces and the impact on charge mobility in all-polymer field-effect transistors. Soft Matter, 4(11), pp. 2220-2224. doi:10.1039/b810278c

Higgins, Anthony, Shion Seng Chang, Ana B. Rodríguez, Chuan Liu, Mark Geoghegan, Henning Sirringhaus, Fabrice Cousin, Robert M. Dalgleish, and Yvonne Deng. "Control of Roughness At Interfaces and the Impact On Charge Mobility in All-polymer Field-effect Transistors." Soft Matter 4, no. 11 (2008): 2220-2224.

Higgins, Anthony, et al. "Control of Roughness At Interfaces and the Impact On Charge Mobility in All-polymer Field-effect Transistors." Soft Matter 4.11 (2008): 2220-2224.