Journal article 1099 views
Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
R. J. Cobley,
P. Rees,
K. S. Teng,
S. P. Wilks,
Steve Wilks,
Vincent Teng 
,
Richard Cobley ,
Paul Rees
,
Richard Cobley ,
Paul Rees
Journal of Applied Physics, Volume: 107, Issue: 9, Start page: 094507
Swansea University Authors:
Steve Wilks, Vincent Teng , Richard Cobley , Paul Rees
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1063/1.3380826
Abstract
Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
| Published in: | Journal of Applied Physics |
|---|---|
| ISBN: | N/A |
| ISSN: | 00218979 |
| Published: |
2010
|
| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa5566 |
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| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
9 |
| Start Page: |
094507 |