Journal article 1416 views
Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
R. J Cobley,
K. S Teng,
M. R Brown,
S. P Wilks,
Vincent Teng 
,
Rowan Brown ,
Richard Cobley
,
Rowan Brown ,
Richard Cobley
Journal of Applied Physics, Volume: 102, Start page: 024306
Swansea University Authors:
Vincent Teng , Rowan Brown , Richard Cobley
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1063/1.2757006
Abstract
Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
| Published in: | Journal of Applied Physics |
|---|---|
| Published: |
2007
|
| URI: | https://cronfa.swan.ac.uk/Record/cronfa1852 |
| College: |
Faculty of Science and Engineering |
|---|---|
| Start Page: |
024306 |