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Cross-sectional scanning tunneling microscopy of biased semiconductor lasers

R. J Cobley, K. S Teng, M. R Brown, S. P Wilks, Vincent Teng Orcid Logo, Rowan Brown Orcid Logo, Richard Cobley Orcid Logo

Journal of Applied Physics, Volume: 102, Start page: 024306

Swansea University Authors: Vincent Teng Orcid Logo, Rowan Brown Orcid Logo, Richard Cobley Orcid Logo

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DOI (Published version): 10.1063/1.2757006

Published in: Journal of Applied Physics
Published: 2007
URI: https://cronfa.swan.ac.uk/Record/cronfa1852
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first_indexed 2013-07-23T11:48:38Z
last_indexed 2018-02-09T04:29:31Z
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spelling 2011-10-01T00:00:00.0000000 v2 1852 2011-10-01 Cross-sectional scanning tunneling microscopy of biased semiconductor lasers 98f529f56798da1ba3e6e93d2817c114 0000-0003-4325-8573 Vincent Teng Vincent Teng true false d7db8d42c476dfa69c15ce06d29bd863 0000-0003-3628-2524 Rowan Brown Rowan Brown true false 2ce7e1dd9006164425415a35fa452494 0000-0003-4833-8492 Richard Cobley Richard Cobley true false 2011-10-01 EEEG Journal Article Journal of Applied Physics 102 024306 31 12 2007 2007-12-31 10.1063/1.2757006 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2011-10-01T00:00:00.0000000 2011-10-01T00:00:00.0000000 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering R. J Cobley 1 K. S Teng 2 M. R Brown 3 S. P Wilks 4 Vincent Teng 0000-0003-4325-8573 5 Rowan Brown 0000-0003-3628-2524 6 Richard Cobley 0000-0003-4833-8492 7
title Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
spellingShingle Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
Vincent Teng
Rowan Brown
Richard Cobley
title_short Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
title_full Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
title_fullStr Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
title_full_unstemmed Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
title_sort Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
author_id_str_mv 98f529f56798da1ba3e6e93d2817c114
d7db8d42c476dfa69c15ce06d29bd863
2ce7e1dd9006164425415a35fa452494
author_id_fullname_str_mv 98f529f56798da1ba3e6e93d2817c114_***_Vincent Teng
d7db8d42c476dfa69c15ce06d29bd863_***_Rowan Brown
2ce7e1dd9006164425415a35fa452494_***_Richard Cobley
author Vincent Teng
Rowan Brown
Richard Cobley
author2 R. J Cobley
K. S Teng
M. R Brown
S. P Wilks
Vincent Teng
Rowan Brown
Richard Cobley
format Journal article
container_title Journal of Applied Physics
container_volume 102
container_start_page 024306
publishDate 2007
institution Swansea University
doi_str_mv 10.1063/1.2757006
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
document_store_str 0
active_str 0
published_date 2007-12-31T03:04:47Z
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score 11.013731

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