Wilks, S., Cobley, R. J., Rees, P., Teng, K. S., Wilks, S. P., Teng, V., . . . Rees, P. (2010). Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy. Journal of Applied Physics, 107(9), p. 094507. doi:10.1063/1.3380826

Wilks, Steve, R. J. Cobley, P. Rees, K. S. Teng, S. P. Wilks, Vincent Teng, Richard Cobley, and Paul Rees. "Analyzing Real-time Surface Modification of Operating Semiconductor Laser Diodes Using Cross-sectional Scanning Tunneling Microscopy." Journal of Applied Physics 107, no. 9 (2010): 094507.

Wilks, Steve, et al. "Analyzing Real-time Surface Modification of Operating Semiconductor Laser Diodes Using Cross-sectional Scanning Tunneling Microscopy." Journal of Applied Physics 107.9 (2010): 094507.