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First results from in situ transmission electron microscopy studies of all-solid-state fluoride ion batteries

Mohammed Hammad Fawey, Venkata Sai Kiran Chakravadhanula, Anji Munnangi Orcid Logo, Carine Rongeat, Horst Hahn, Maximilian Fichtner, Christian Kübel

Journal of Power Sources, Volume: 466, Start page: 228283

Swansea University Author: Anji Munnangi Orcid Logo

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Abstract

A focused ion beam (FIB) system is used to fabricate a micron-sized all-solid-state fluoride ion cell from a bulk battery for in situ transmission electron microscopy (TEM) testing. The bulk battery is based on a La0·9Ba0·1F2.9 solid-state electrolyte with a nanocomposite of Cu/C as a cathode and a...

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Published in: Journal of Power Sources
ISSN: 0378-7753
Published: Elsevier BV 2020
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa54756
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Abstract: A focused ion beam (FIB) system is used to fabricate a micron-sized all-solid-state fluoride ion cell from a bulk battery for in situ transmission electron microscopy (TEM) testing. The bulk battery is based on a La0·9Ba0·1F2.9 solid-state electrolyte with a nanocomposite of Cu/C as a cathode and a nanocomposite of MgF2, Mg, La0·9Ba0·1F2.9 and C as an anode. The evolution of the morphology, structure, and composition of the electrodes and their interfaces with the electrolyte is characterized using in-situ TEM during electrochemical cycling. The high-resolution transmission electron microscopy (HRTEM) and scanning transmission electron microscopy-energy dispersive X-ray (STEM-EDX) analysis of the cathode-electrolyte interface reveal the expected formation of CuF2 phase during charging. During cycling, grain growth of Cu in the cathode ingredients and Cu diffusion from the cathode into the electrolyte are observed in addition to void formation.
Keywords: In situ transmission electron microscopy (TEM), Focused ion beam (FIB), Fluoride ion battery, All-solid-state battery, Electrode/electrolyte interfaces, Electrochemistry
College: Faculty of Science and Engineering
Start Page: 228283