Conference Paper/Proceeding/Abstract 911 views
An Observer Based Sample Detection Scheme for Atomic Force Microscopy
A. Sebastian,
D.R. Sahoo,
M.V. Salapaka,
Deepak Sahoo 
Proceedings of the IEEE Conference on Decision and Control, Volume: 3
Swansea University Author:
Deepak Sahoo
Abstract
An Observer Based Sample Detection Scheme for Atomic Force Microscopy
| Published in: | Proceedings of the IEEE Conference on Decision and Control |
|---|---|
| Published: |
2003
|
| Online Access: |
http://www.scopus.com/inward/record.url?eid=2-s2.0-1542349121&partnerID=MN8TOARS |
| URI: | https://cronfa.swan.ac.uk/Record/cronfa38932 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| College: |
Faculty of Science and Engineering |
|---|