An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy

Journal article 1044 views

DR Sahoo, A Sebastian, MV Salapaka, M Laudon, B Romanowicz, Deepak Sahoo

Nsti Nanotech 2004, Vol 3, Technical Proceedings

Swansea University Author: Deepak Sahoo

Published in:	Nsti Nanotech 2004, Vol 3, Technical Proceedings
Published:	2004
Online Access:	http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000223078200004&KeyUID=WOS:000223078200004
URI:	https://cronfa.swan.ac.uk/Record/cronfa38931

College:	Faculty of Science and Engineering