Observer based imaging methods for atomic force microscopy

Conference Paper/Proceeding/Abstract 946 views

D.R. Sahoo, T. De, M.V. Salapaka, Deepak Sahoo

Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05, Volume: 2005

Swansea University Author: Deepak Sahoo

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DOI (Published version): 10.1109/CDC.2005.1582319

Published in:	Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Published:	2005
Online Access:	http://www.scopus.com/inward/record.url?eid=2-s2.0-33847205755&partnerID=MN8TOARS
URI:	https://cronfa.swan.ac.uk/Record/cronfa32170

College:	Faculty of Science and Engineering