Conference Paper/Proceeding/Abstract 941 views
Observer based imaging methods for atomic force microscopy
D.R. Sahoo,
T. De,
M.V. Salapaka,
Deepak Sahoo 
Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05, Volume: 2005
Swansea University Author:
Deepak Sahoo
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DOI (Published version): 10.1109/CDC.2005.1582319
Abstract
Observer based imaging methods for atomic force microscopy
| Published in: | Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05 |
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| Published: |
2005
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| Online Access: |
http://www.scopus.com/inward/record.url?eid=2-s2.0-33847205755&partnerID=MN8TOARS |
| URI: | https://cronfa.swan.ac.uk/Record/cronfa32170 |
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| College: |
Faculty of Science and Engineering |
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