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Conference Paper/Proceeding/Abstract 941 views

Observer based imaging methods for atomic force microscopy

D.R. Sahoo, T. De, M.V. Salapaka, Deepak Sahoo Orcid Logo

Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05, Volume: 2005

Swansea University Author: Deepak Sahoo Orcid Logo

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DOI (Published version): 10.1109/CDC.2005.1582319

Published in: Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Published: 2005
Online Access: http://www.scopus.com/inward/record.url?eid=2-s2.0-33847205755&partnerID=MN8TOARS
URI: https://cronfa.swan.ac.uk/Record/cronfa32170
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first_indexed 2017-02-28T13:32:24Z
last_indexed 2018-02-09T05:19:48Z
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spelling 2017-02-28T09:35:25.0265866 v2 32170 2017-02-28 Observer based imaging methods for atomic force microscopy c7b57876957049ac9718ff1b265fb2ce 0000-0002-4421-7549 Deepak Sahoo Deepak Sahoo true false 2017-02-28 SCS Conference Paper/Proceeding/Abstract Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05 2005 31 12 2005 2005-12-31 10.1109/CDC.2005.1582319 http://www.scopus.com/inward/record.url?eid=2-s2.0-33847205755&amp;partnerID=MN8TOARS COLLEGE NANME Computer Science COLLEGE CODE SCS Swansea University 2017-02-28T09:35:25.0265866 2017-02-28T09:35:24.4649756 Faculty of Science and Engineering School of Mathematics and Computer Science - Computer Science D.R. Sahoo 1 T. De 2 M.V. Salapaka 3 Deepak Sahoo 0000-0002-4421-7549 4
title Observer based imaging methods for atomic force microscopy
spellingShingle Observer based imaging methods for atomic force microscopy
Deepak Sahoo
title_short Observer based imaging methods for atomic force microscopy
title_full Observer based imaging methods for atomic force microscopy
title_fullStr Observer based imaging methods for atomic force microscopy
title_full_unstemmed Observer based imaging methods for atomic force microscopy
title_sort Observer based imaging methods for atomic force microscopy
author_id_str_mv c7b57876957049ac9718ff1b265fb2ce
author_id_fullname_str_mv c7b57876957049ac9718ff1b265fb2ce_***_Deepak Sahoo
author Deepak Sahoo
author2 D.R. Sahoo
T. De
M.V. Salapaka
Deepak Sahoo
format Conference Paper/Proceeding/Abstract
container_title Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
container_volume 2005
publishDate 2005
institution Swansea University
doi_str_mv 10.1109/CDC.2005.1582319
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Mathematics and Computer Science - Computer Science{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Mathematics and Computer Science - Computer Science
url http://www.scopus.com/inward/record.url?eid=2-s2.0-33847205755&amp;partnerID=MN8TOARS
document_store_str 0
active_str 0
published_date 2005-12-31T03:39:23Z
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score 11.037275

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