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On maximum likelihood estimation for the two parameter Weibull distribution

A.J. Watkins, Alan Watkins Orcid Logo

Microelectronics Reliability, Volume: 36, Issue: 5, Pages: 595 - 603

Swansea University Author: Alan Watkins Orcid Logo

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DOI (Published version): 10.1016/0026-2714(95)00171-9

Published in: Microelectronics Reliability
ISSN: 00262714
Published: 1996
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa34288
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first_indexed 2017-06-13T20:08:30Z
last_indexed 2018-02-09T05:24:14Z
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spelling 2017-06-13T16:36:20.4655525 v2 34288 2017-06-13 On maximum likelihood estimation for the two parameter Weibull distribution 81fc05c9333d9df41b041157437bcc2f 0000-0003-3804-1943 Alan Watkins Alan Watkins true false 2017-06-13 HDAT Journal Article Microelectronics Reliability 36 5 595 603 00262714 31 12 1996 1996-12-31 10.1016/0026-2714(95)00171-9 http://www.scopus.com/inward/record.url?eid=2-s2.0-0030144961&amp;partnerID=MN8TOARS COLLEGE NANME Health Data Science COLLEGE CODE HDAT Swansea University 2017-06-13T16:36:20.4655525 2017-06-13T16:36:20.2003337 Faculty of Medicine, Health and Life Sciences Swansea University Medical School - Medicine A.J. Watkins 1 Alan Watkins 0000-0003-3804-1943 2
title On maximum likelihood estimation for the two parameter Weibull distribution
spellingShingle On maximum likelihood estimation for the two parameter Weibull distribution
Alan Watkins
title_short On maximum likelihood estimation for the two parameter Weibull distribution
title_full On maximum likelihood estimation for the two parameter Weibull distribution
title_fullStr On maximum likelihood estimation for the two parameter Weibull distribution
title_full_unstemmed On maximum likelihood estimation for the two parameter Weibull distribution
title_sort On maximum likelihood estimation for the two parameter Weibull distribution
author_id_str_mv 81fc05c9333d9df41b041157437bcc2f
author_id_fullname_str_mv 81fc05c9333d9df41b041157437bcc2f_***_Alan Watkins
author Alan Watkins
author2 A.J. Watkins
Alan Watkins
format Journal article
container_title Microelectronics Reliability
container_volume 36
container_issue 5
container_start_page 595
publishDate 1996
institution Swansea University
issn 00262714
doi_str_mv 10.1016/0026-2714(95)00171-9
college_str Faculty of Medicine, Health and Life Sciences
hierarchytype
hierarchy_top_id facultyofmedicinehealthandlifesciences
hierarchy_top_title Faculty of Medicine, Health and Life Sciences
hierarchy_parent_id facultyofmedicinehealthandlifesciences
hierarchy_parent_title Faculty of Medicine, Health and Life Sciences
department_str Swansea University Medical School - Medicine{{{_:::_}}}Faculty of Medicine, Health and Life Sciences{{{_:::_}}}Swansea University Medical School - Medicine
url http://www.scopus.com/inward/record.url?eid=2-s2.0-0030144961&amp;partnerID=MN8TOARS
document_store_str 0
active_str 0
published_date 1996-12-31T03:42:31Z
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score 11.037056

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