On maximum likelihood estimation for the two parameter Weibull distribution

Journal article 1260 views

A.J. Watkins, Alan Watkins

Microelectronics Reliability, Volume: 36, Issue: 5, Pages: 595 - 603

Swansea University Author: Alan Watkins

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DOI (Published version): 10.1016/0026-2714(95)00171-9

Published in:	Microelectronics Reliability
ISSN:	00262714
Published:	1996
Online Access:	Check full text
URI:	https://cronfa.swan.ac.uk/Record/cronfa34288

College:	Faculty of Medicine, Health and Life Sciences
Issue:	5
Start Page:	595
End Page:	603