Journal article 947 views
On maximum likelihood estimation for the two parameter Weibull distribution
A.J. Watkins,
Alan Watkins 
Microelectronics Reliability, Volume: 36, Issue: 5, Pages: 595 - 603
Swansea University Author:
Alan Watkins
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1016/0026-2714(95)00171-9
Abstract
On maximum likelihood estimation for the two parameter Weibull distribution
| Published in: | Microelectronics Reliability |
|---|---|
| ISSN: | 00262714 |
| Published: |
1996
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa34288 |
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| College: |
Faculty of Medicine, Health and Life Sciences |
|---|---|
| Issue: |
5 |
| Start Page: |
595 |
| End Page: |
603 |