No Cover Image

Journal article 830 views

Harnessing the transient signals in atomic force microscopy

D.R. Sahoo, A. Sebastian, M.V. Salapaka, Deepak Sahoo Orcid Logo

International Journal of Robust and Nonlinear Control, Volume: 15, Issue: 16, Pages: 805 - 820

Swansea University Author: Deepak Sahoo Orcid Logo

Full text not available from this repository: check for access using links below.

Check full text

DOI (Published version): 10.1002/rnc.1025

Published in: International Journal of Robust and Nonlinear Control
ISSN: 1049-8923 1099-1239
Published: 2005
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa32169
Tags: Add Tag
No Tags, Be the first to tag this record!
first_indexed 2017-02-28T13:32:24Z
last_indexed 2018-02-09T05:19:48Z
id cronfa32169
recordtype SURis
fullrecord <?xml version="1.0"?><rfc1807><datestamp>2017-02-28T09:35:24.0281734</datestamp><bib-version>v2</bib-version><id>32169</id><entry>2017-02-28</entry><title>Harnessing the transient signals in atomic force microscopy</title><swanseaauthors><author><sid>c7b57876957049ac9718ff1b265fb2ce</sid><ORCID>0000-0002-4421-7549</ORCID><firstname>Deepak</firstname><surname>Sahoo</surname><name>Deepak Sahoo</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2017-02-28</date><deptcode>SCS</deptcode><abstract/><type>Journal Article</type><journal>International Journal of Robust and Nonlinear Control</journal><volume>15</volume><journalNumber>16</journalNumber><paginationStart>805</paginationStart><paginationEnd>820</paginationEnd><publisher/><issnPrint>1049-8923</issnPrint><issnElectronic>1099-1239</issnElectronic><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2005</publishedYear><publishedDate>2005-12-31</publishedDate><doi>10.1002/rnc.1025</doi><url>http://www.scopus.com/inward/record.url?eid=2-s2.0-27644528153&amp;amp;partnerID=MN8TOARS</url><notes/><college>COLLEGE NANME</college><department>Computer Science</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>SCS</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2017-02-28T09:35:24.0281734</lastEdited><Created>2017-02-28T09:35:23.5601755</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Mathematics and Computer Science - Computer Science</level></path><authors><author><firstname>D.R.</firstname><surname>Sahoo</surname><order>1</order></author><author><firstname>A.</firstname><surname>Sebastian</surname><order>2</order></author><author><firstname>M.V.</firstname><surname>Salapaka</surname><order>3</order></author><author><firstname>Deepak</firstname><surname>Sahoo</surname><orcid>0000-0002-4421-7549</orcid><order>4</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2017-02-28T09:35:24.0281734 v2 32169 2017-02-28 Harnessing the transient signals in atomic force microscopy c7b57876957049ac9718ff1b265fb2ce 0000-0002-4421-7549 Deepak Sahoo Deepak Sahoo true false 2017-02-28 SCS Journal Article International Journal of Robust and Nonlinear Control 15 16 805 820 1049-8923 1099-1239 31 12 2005 2005-12-31 10.1002/rnc.1025 http://www.scopus.com/inward/record.url?eid=2-s2.0-27644528153&amp;partnerID=MN8TOARS COLLEGE NANME Computer Science COLLEGE CODE SCS Swansea University 2017-02-28T09:35:24.0281734 2017-02-28T09:35:23.5601755 Faculty of Science and Engineering School of Mathematics and Computer Science - Computer Science D.R. Sahoo 1 A. Sebastian 2 M.V. Salapaka 3 Deepak Sahoo 0000-0002-4421-7549 4
title Harnessing the transient signals in atomic force microscopy
spellingShingle Harnessing the transient signals in atomic force microscopy
Deepak Sahoo
title_short Harnessing the transient signals in atomic force microscopy
title_full Harnessing the transient signals in atomic force microscopy
title_fullStr Harnessing the transient signals in atomic force microscopy
title_full_unstemmed Harnessing the transient signals in atomic force microscopy
title_sort Harnessing the transient signals in atomic force microscopy
author_id_str_mv c7b57876957049ac9718ff1b265fb2ce
author_id_fullname_str_mv c7b57876957049ac9718ff1b265fb2ce_***_Deepak Sahoo
author Deepak Sahoo
author2 D.R. Sahoo
A. Sebastian
M.V. Salapaka
Deepak Sahoo
format Journal article
container_title International Journal of Robust and Nonlinear Control
container_volume 15
container_issue 16
container_start_page 805
publishDate 2005
institution Swansea University
issn 1049-8923
1099-1239
doi_str_mv 10.1002/rnc.1025
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Mathematics and Computer Science - Computer Science{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Mathematics and Computer Science - Computer Science
url http://www.scopus.com/inward/record.url?eid=2-s2.0-27644528153&amp;partnerID=MN8TOARS
document_store_str 0
active_str 0
published_date 2005-12-31T03:39:23Z
_version_ 1763751769538560000
score 11.014067

Similar Items