No Cover Image

Conference Paper/Proceeding/Abstract 826 views

Transient force atomic force microscopy: A new nano-interrogation method

D.R. Sahoo, P. Agarwal, M.V. Salapaka, Deepak Sahoo Orcid Logo

Proceedings of the American Control Conference

Swansea University Author: Deepak Sahoo Orcid Logo

Full text not available from this repository: check for access using links below.

DOI (Published version): 10.1109/ACC.2007.4283047

Published in: Proceedings of the American Control Conference
Published: 2007
Online Access: http://www.scopus.com/inward/record.url?eid=2-s2.0-46449110304&partnerID=MN8TOARS
URI: https://cronfa.swan.ac.uk/Record/cronfa32167
Tags: Add Tag
No Tags, Be the first to tag this record!
first_indexed 2017-02-28T13:32:24Z
last_indexed 2018-02-09T05:19:48Z
id cronfa32167
recordtype SURis
fullrecord <?xml version="1.0"?><rfc1807><datestamp>2017-02-28T09:35:22.2653452</datestamp><bib-version>v2</bib-version><id>32167</id><entry>2017-02-28</entry><title>Transient force atomic force microscopy: A new nano-interrogation method</title><swanseaauthors><author><sid>c7b57876957049ac9718ff1b265fb2ce</sid><ORCID>0000-0002-4421-7549</ORCID><firstname>Deepak</firstname><surname>Sahoo</surname><name>Deepak Sahoo</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2017-02-28</date><deptcode>SCS</deptcode><abstract/><type>Conference Paper/Proceeding/Abstract</type><journal>Proceedings of the American Control Conference</journal><publisher/><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2007</publishedYear><publishedDate>2007-12-31</publishedDate><doi>10.1109/ACC.2007.4283047</doi><url>http://www.scopus.com/inward/record.url?eid=2-s2.0-46449110304&amp;amp;partnerID=MN8TOARS</url><notes/><college>COLLEGE NANME</college><department>Computer Science</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>SCS</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2017-02-28T09:35:22.2653452</lastEdited><Created>2017-02-28T09:35:21.9221462</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Mathematics and Computer Science - Computer Science</level></path><authors><author><firstname>D.R.</firstname><surname>Sahoo</surname><order>1</order></author><author><firstname>P.</firstname><surname>Agarwal</surname><order>2</order></author><author><firstname>M.V.</firstname><surname>Salapaka</surname><order>3</order></author><author><firstname>Deepak</firstname><surname>Sahoo</surname><orcid>0000-0002-4421-7549</orcid><order>4</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2017-02-28T09:35:22.2653452 v2 32167 2017-02-28 Transient force atomic force microscopy: A new nano-interrogation method c7b57876957049ac9718ff1b265fb2ce 0000-0002-4421-7549 Deepak Sahoo Deepak Sahoo true false 2017-02-28 SCS Conference Paper/Proceeding/Abstract Proceedings of the American Control Conference 31 12 2007 2007-12-31 10.1109/ACC.2007.4283047 http://www.scopus.com/inward/record.url?eid=2-s2.0-46449110304&amp;partnerID=MN8TOARS COLLEGE NANME Computer Science COLLEGE CODE SCS Swansea University 2017-02-28T09:35:22.2653452 2017-02-28T09:35:21.9221462 Faculty of Science and Engineering School of Mathematics and Computer Science - Computer Science D.R. Sahoo 1 P. Agarwal 2 M.V. Salapaka 3 Deepak Sahoo 0000-0002-4421-7549 4
title Transient force atomic force microscopy: A new nano-interrogation method
spellingShingle Transient force atomic force microscopy: A new nano-interrogation method
Deepak Sahoo
title_short Transient force atomic force microscopy: A new nano-interrogation method
title_full Transient force atomic force microscopy: A new nano-interrogation method
title_fullStr Transient force atomic force microscopy: A new nano-interrogation method
title_full_unstemmed Transient force atomic force microscopy: A new nano-interrogation method
title_sort Transient force atomic force microscopy: A new nano-interrogation method
author_id_str_mv c7b57876957049ac9718ff1b265fb2ce
author_id_fullname_str_mv c7b57876957049ac9718ff1b265fb2ce_***_Deepak Sahoo
author Deepak Sahoo
author2 D.R. Sahoo
P. Agarwal
M.V. Salapaka
Deepak Sahoo
format Conference Paper/Proceeding/Abstract
container_title Proceedings of the American Control Conference
publishDate 2007
institution Swansea University
doi_str_mv 10.1109/ACC.2007.4283047
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Mathematics and Computer Science - Computer Science{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Mathematics and Computer Science - Computer Science
url http://www.scopus.com/inward/record.url?eid=2-s2.0-46449110304&amp;partnerID=MN8TOARS
document_store_str 0
active_str 0
published_date 2007-12-31T03:39:22Z
_version_ 1763751769296338944
score 11.013776

Similar Items