Sahoo, D., Sahoo, D., Agarwal, P., & Salapaka, M. (2007). Transient force atomic force microscopy: A new nano-interrogation method. Proceedings of the American Control Conference. doi:10.1109/ACC.2007.4283047
Chicago Style CitationSahoo, Deepak, D.R Sahoo, P. Agarwal, and M.V Salapaka. "Transient Force Atomic Force Microscopy: A New Nano-interrogation Method." Proceedings of the American Control Conference 2007.
MLA CitationSahoo, Deepak, D.R Sahoo, P. Agarwal, and M.V Salapaka. "Transient Force Atomic Force Microscopy: A New Nano-interrogation Method." Proceedings of the American Control Conference 2007.
Warning: These citations may not always be 100% accurate.