Journal article 909 views
STM/STS investigation of the interaction of Si with atomic scale vacancies on cleaved GaAs
K.S. Teng,
P.R. Dunstan,
S.P. Wilks,
R.H. Williams,
Vincent Teng 
Applied Surface Science, Volume: 235, Issue: 3, Pages: 313 - 321
Swansea University Author:
Vincent Teng
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1016/j.apsusc.2004.05.104
Abstract
STM/STS investigation of the interaction of Si with atomic scale vacancies on cleaved GaAs
| Published in: | Applied Surface Science |
|---|---|
| ISSN: | 01694332 |
| Published: |
2004
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa31371 |
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| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
3 |
| Start Page: |
313 |
| End Page: |
321 |