Journal article 1115 views
Monte Carlo Study of Ultimate Channel Scaling in Si and In0.3Ga0.7As Bulk MOSFETs
Karol Kalna 
IEEE Transactions on Nanotechnology, Volume: 10, Issue: 6
Swansea University Author:
Karol Kalna
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DOI (Published version): 10.1109/TNANO.2011.2165555
Abstract
Monte Carlo Study of Ultimate Channel Scaling in Si and In0.3Ga0.7As Bulk MOSFETs
| Published in: | IEEE Transactions on Nanotechnology |
|---|---|
| Published: |
2011
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa9160 |
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| College: |
Faculty of Science and Engineering |
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| Issue: |
6 |