Conference Paper/Proceeding/Abstract 75 views
Streamlining Accurate 4D-STEM Phase-Orientation Analysis of Polymorphic Polycrystalline Thin Films in Semiconductor TEM Labs for Routine Application
Daniel Nemecek,
Tiantian Chai,
Zabeada Aslam,
Andy Brown,
Rik Drummond-Brydson,
Gregory Burwell 
,
Paul Meredith
,
Paul Meredith
ISTFA 2025: Conference Proceedings from the 51st International Symposium for Testing and Failure Analysis, Pages: 589 - 593
Swansea University Authors:
Gregory Burwell , Paul Meredith
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.31399/asm.cp.istfa2025p0589
Abstract
Streamlining Accurate 4D-STEM Phase-Orientation Analysis of Polymorphic Polycrystalline Thin Films in Semiconductor TEM Labs for Routine Application
| Published in: | ISTFA 2025: Conference Proceedings from the 51st International Symposium for Testing and Failure Analysis |
|---|---|
| ISSN: | 0890-1740 |
| Published: |
ASM International
2025
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa70959 |
| first_indexed |
2025-11-21T13:22:38Z |
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| last_indexed |
2025-11-22T05:32:26Z |
| id |
cronfa70959 |
| recordtype |
SURis |
| fullrecord |
<?xml version="1.0"?><rfc1807><datestamp>2025-11-21T13:45:31.3099449</datestamp><bib-version>v2</bib-version><id>70959</id><entry>2025-11-21</entry><title>Streamlining Accurate 4D-STEM Phase-Orientation Analysis of Polymorphic Polycrystalline Thin Films in Semiconductor TEM Labs for Routine Application</title><swanseaauthors><author><sid>49890fbfbe127d4ae94bc10dc2b24199</sid><ORCID>0000-0002-2534-9626</ORCID><firstname>Gregory</firstname><surname>Burwell</surname><name>Gregory Burwell</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>31e8fe57fa180d418afd48c3af280c2e</sid><ORCID>0000-0002-9049-7414</ORCID><firstname>Paul</firstname><surname>Meredith</surname><name>Paul Meredith</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2025-11-21</date><deptcode>BGPS</deptcode><abstract/><type>Conference Paper/Proceeding/Abstract</type><journal>ISTFA 2025: Conference Proceedings from the 51st International Symposium for Testing and Failure Analysis</journal><volume/><journalNumber/><paginationStart>589</paginationStart><paginationEnd>593</paginationEnd><publisher>ASM International</publisher><placeOfPublication/><isbnPrint/><isbnElectronic/><issnPrint>0890-1740</issnPrint><issnElectronic/><keywords>deep learning, electron diffraction, nanoscale, phase orientation analysis, polymorphic polycrystalline thin films, scanning transmission electron microscopy, semiconductor devices</keywords><publishedDay>16</publishedDay><publishedMonth>11</publishedMonth><publishedYear>2025</publishedYear><publishedDate>2025-11-16</publishedDate><doi>10.31399/asm.cp.istfa2025p0589</doi><url/><notes/><college>COLLEGE NANME</college><department>Biosciences Geography and Physics School</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>BGPS</DepartmentCode><institution>Swansea University</institution><apcterm>Not Required</apcterm><funders>Tiantian Chai acknowledges a UK Engineering and Physical Sciences Research Council CASE Studentship award (with Tescan). P.M. and G.B. are funded by UKRI through the Research England RPIF Program ‘Centre for Integrative Semiconductor Materials’. The work was supported by the
Avenues of Commercialisation for Nano & Micro technologies (ACNM) through the Welsh European Funding Office. This work was further supported by the Welsh Government’s Sêr Cymru II Rising Star and Capacity Builder Accelerator Programs through the European Regional Development Fund,
Welsh European Funding Office, and Swansea University Strategic Initiative in Sustainable Advanced Materials. P.M.is a Sêr Cymru II National Research Chair.</funders><projectreference/><lastEdited>2025-11-21T13:45:31.3099449</lastEdited><Created>2025-11-21T11:32:12.9460119</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Biosciences, Geography and Physics - Physics</level></path><authors><author><firstname>Daniel</firstname><surname>Nemecek</surname><order>1</order></author><author><firstname>Tiantian</firstname><surname>Chai</surname><order>2</order></author><author><firstname>Zabeada</firstname><surname>Aslam</surname><order>3</order></author><author><firstname>Andy</firstname><surname>Brown</surname><order>4</order></author><author><firstname>Rik</firstname><surname>Drummond-Brydson</surname><order>5</order></author><author><firstname>Gregory</firstname><surname>Burwell</surname><orcid>0000-0002-2534-9626</orcid><order>6</order></author><author><firstname>Paul</firstname><surname>Meredith</surname><orcid>0000-0002-9049-7414</orcid><order>7</order></author></authors><documents/><OutputDurs/></rfc1807> |
| spelling |
2025-11-21T13:45:31.3099449 v2 70959 2025-11-21 Streamlining Accurate 4D-STEM Phase-Orientation Analysis of Polymorphic Polycrystalline Thin Films in Semiconductor TEM Labs for Routine Application 49890fbfbe127d4ae94bc10dc2b24199 0000-0002-2534-9626 Gregory Burwell Gregory Burwell true false 31e8fe57fa180d418afd48c3af280c2e 0000-0002-9049-7414 Paul Meredith Paul Meredith true false 2025-11-21 BGPS Conference Paper/Proceeding/Abstract ISTFA 2025: Conference Proceedings from the 51st International Symposium for Testing and Failure Analysis 589 593 ASM International 0890-1740 deep learning, electron diffraction, nanoscale, phase orientation analysis, polymorphic polycrystalline thin films, scanning transmission electron microscopy, semiconductor devices 16 11 2025 2025-11-16 10.31399/asm.cp.istfa2025p0589 COLLEGE NANME Biosciences Geography and Physics School COLLEGE CODE BGPS Swansea University Not Required Tiantian Chai acknowledges a UK Engineering and Physical Sciences Research Council CASE Studentship award (with Tescan). P.M. and G.B. are funded by UKRI through the Research England RPIF Program ‘Centre for Integrative Semiconductor Materials’. The work was supported by the Avenues of Commercialisation for Nano & Micro technologies (ACNM) through the Welsh European Funding Office. This work was further supported by the Welsh Government’s Sêr Cymru II Rising Star and Capacity Builder Accelerator Programs through the European Regional Development Fund, Welsh European Funding Office, and Swansea University Strategic Initiative in Sustainable Advanced Materials. P.M.is a Sêr Cymru II National Research Chair. 2025-11-21T13:45:31.3099449 2025-11-21T11:32:12.9460119 Faculty of Science and Engineering School of Biosciences, Geography and Physics - Physics Daniel Nemecek 1 Tiantian Chai 2 Zabeada Aslam 3 Andy Brown 4 Rik Drummond-Brydson 5 Gregory Burwell 0000-0002-2534-9626 6 Paul Meredith 0000-0002-9049-7414 7 |
| title |
Streamlining Accurate 4D-STEM Phase-Orientation Analysis of Polymorphic Polycrystalline Thin Films in Semiconductor TEM Labs for Routine Application |
| spellingShingle |
Streamlining Accurate 4D-STEM Phase-Orientation Analysis of Polymorphic Polycrystalline Thin Films in Semiconductor TEM Labs for Routine Application Gregory Burwell Paul Meredith |
| title_short |
Streamlining Accurate 4D-STEM Phase-Orientation Analysis of Polymorphic Polycrystalline Thin Films in Semiconductor TEM Labs for Routine Application |
| title_full |
Streamlining Accurate 4D-STEM Phase-Orientation Analysis of Polymorphic Polycrystalline Thin Films in Semiconductor TEM Labs for Routine Application |
| title_fullStr |
Streamlining Accurate 4D-STEM Phase-Orientation Analysis of Polymorphic Polycrystalline Thin Films in Semiconductor TEM Labs for Routine Application |
| title_full_unstemmed |
Streamlining Accurate 4D-STEM Phase-Orientation Analysis of Polymorphic Polycrystalline Thin Films in Semiconductor TEM Labs for Routine Application |
| title_sort |
Streamlining Accurate 4D-STEM Phase-Orientation Analysis of Polymorphic Polycrystalline Thin Films in Semiconductor TEM Labs for Routine Application |
| author_id_str_mv |
49890fbfbe127d4ae94bc10dc2b24199 31e8fe57fa180d418afd48c3af280c2e |
| author_id_fullname_str_mv |
49890fbfbe127d4ae94bc10dc2b24199_***_Gregory Burwell 31e8fe57fa180d418afd48c3af280c2e_***_Paul Meredith |
| author |
Gregory Burwell Paul Meredith |
| author2 |
Daniel Nemecek Tiantian Chai Zabeada Aslam Andy Brown Rik Drummond-Brydson Gregory Burwell Paul Meredith |
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Conference Paper/Proceeding/Abstract |
| container_title |
ISTFA 2025: Conference Proceedings from the 51st International Symposium for Testing and Failure Analysis |
| container_start_page |
589 |
| publishDate |
2025 |
| institution |
Swansea University |
| issn |
0890-1740 |
| doi_str_mv |
10.31399/asm.cp.istfa2025p0589 |
| publisher |
ASM International |
| college_str |
Faculty of Science and Engineering |
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|
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facultyofscienceandengineering |
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Faculty of Science and Engineering |
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facultyofscienceandengineering |
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Faculty of Science and Engineering |
| department_str |
School of Biosciences, Geography and Physics - Physics{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Biosciences, Geography and Physics - Physics |
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2025-11-16T05:30:50Z |
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11.089572 |