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Effect of interface state trap density on the performance of scaled surface channel In<sub>0.3</sub>Ga<sub>0.7</sub>As MOSFETs

Karol Kalna Orcid Logo

Journal of Physics: Conference Series

Swansea University Author: Karol Kalna Orcid Logo

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DOI (Published version): 10.1088/1742-6596/193/1/012122

Published in: Journal of Physics: Conference Series
Published: 2009
URI: https://cronfa.swan.ac.uk/Record/cronfa6067
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first_indexed 2013-07-23T11:56:06Z
last_indexed 2018-02-09T04:33:12Z
id cronfa6067
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spelling 2015-05-31T18:02:05.3958395 v2 6067 2013-09-03 Effect of interface state trap density on the performance of scaled surface channel In<sub>0.3</sub>Ga<sub>0.7</sub>As MOSFETs 1329a42020e44fdd13de2f20d5143253 0000-0002-6333-9189 Karol Kalna Karol Kalna true false 2013-09-03 EEEG Journal Article Journal of Physics: Conference Series 31 12 2009 2009-12-31 10.1088/1742-6596/193/1/012122 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2015-05-31T18:02:05.3958395 2013-09-03T06:36:00.0000000 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering Karol Kalna 0000-0002-6333-9189 1
title Effect of interface state trap density on the performance of scaled surface channel In<sub>0.3</sub>Ga<sub>0.7</sub>As MOSFETs
spellingShingle Effect of interface state trap density on the performance of scaled surface channel In<sub>0.3</sub>Ga<sub>0.7</sub>As MOSFETs
Karol Kalna
title_short Effect of interface state trap density on the performance of scaled surface channel In<sub>0.3</sub>Ga<sub>0.7</sub>As MOSFETs
title_full Effect of interface state trap density on the performance of scaled surface channel In<sub>0.3</sub>Ga<sub>0.7</sub>As MOSFETs
title_fullStr Effect of interface state trap density on the performance of scaled surface channel In<sub>0.3</sub>Ga<sub>0.7</sub>As MOSFETs
title_full_unstemmed Effect of interface state trap density on the performance of scaled surface channel In<sub>0.3</sub>Ga<sub>0.7</sub>As MOSFETs
title_sort Effect of interface state trap density on the performance of scaled surface channel In<sub>0.3</sub>Ga<sub>0.7</sub>As MOSFETs
author_id_str_mv 1329a42020e44fdd13de2f20d5143253
author_id_fullname_str_mv 1329a42020e44fdd13de2f20d5143253_***_Karol Kalna
author Karol Kalna
author2 Karol Kalna
format Journal article
container_title Journal of Physics: Conference Series
publishDate 2009
institution Swansea University
doi_str_mv 10.1088/1742-6596/193/1/012122
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
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published_date 2009-12-31T03:07:27Z
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