Journal article 1301 views
NEGF simulations of the effect of strain on scaled double gate nanoMOSFETs
Karol Kalna 
,
Antonio Martinez Muniz
,
Antonio Martinez Muniz
Journal of Computational Electronics
Swansea University Authors:
Karol Kalna , Antonio Martinez Muniz
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DOI (Published version): 10.1007/s10825-008-0212-8
Abstract
NEGF simulations of the effect of strain on scaled double gate nanoMOSFETs
| Published in: | Journal of Computational Electronics |
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| Published: |
2008
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa6059 |
| College: |
Faculty of Science and Engineering |
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