Kalna, K., & Muniz, A. M. (2008). NEGF simulations of the effect of strain on scaled double gate nanoMOSFETs. Journal of Computational Electronics. doi:10.1007/s10825-008-0212-8
Chicago Style CitationKalna, Karol, and Antonio Martinez Muniz. "NEGF Simulations of the Effect of Strain On Scaled Double Gate NanoMOSFETs." Journal of Computational Electronics 2008.
MLA CitationKalna, Karol, and Antonio Martinez Muniz. "NEGF Simulations of the Effect of Strain On Scaled Double Gate NanoMOSFETs." Journal of Computational Electronics 2008.
Warning: These citations may not always be 100% accurate.