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Exploring the Infiltration Features of Perovskite within Mesoporous Carbon Stack Solar Cells Using Broad Beam Ion Milling

Tom Dunlop Orcid Logo, Owen Kesteven, Francesca De Rossi Orcid Logo, Pete Davies, Trystan Watson Orcid Logo, Cecile Charbonneau Orcid Logo

Materials, Volume: 14, Issue: 19, Start page: 5852

Swansea University Authors: Tom Dunlop Orcid Logo, Owen Kesteven, Francesca De Rossi Orcid Logo, Pete Davies, Trystan Watson Orcid Logo, Cecile Charbonneau Orcid Logo

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DOI (Published version): 10.3390/ma14195852

Abstract

Carbon perovskite solar cells (C-PSCs) are a popular photovoltaic technology currently undergoing extensive development on the global research scene. Whilst their record efficiency now rivals that of silicon PV in small-scale devices, C-PSCs still require considerable development to progress to a co...

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Published in: Materials
ISSN: 1996-1944
Published: MDPI AG 2021
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URI: https://cronfa.swan.ac.uk/Record/cronfa58354
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Whilst their record efficiency now rivals that of silicon PV in small-scale devices, C-PSCs still require considerable development to progress to a commercial-scale product. This study is the first of its kind to use broad beam ion milling for C-PSCs. It investigates how the carbon ink, usually optimised for maximum sheet conductivity, impacts the infiltration of the perovskite into the active layers, which in turn impacts the performance of the cells. Through the use of secondary electron microscopy with energy-dispersive X-ray spectroscopy, infiltration defects were revealed relating to carbon flake orientation. The cross sections imaged showed between a 2% and 100% inactive area within the C-PSCs due to this carbon blocking effect. 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spelling 2021-11-09T11:40:44.6340736 v2 58354 2021-10-15 Exploring the Infiltration Features of Perovskite within Mesoporous Carbon Stack Solar Cells Using Broad Beam Ion Milling 809395460ab1e6b53a906b136d919c41 0000-0002-5851-8713 Tom Dunlop Tom Dunlop true false 95b4f4cba277b008ab8b73f52643d871 Owen Kesteven Owen Kesteven true false 04b56f7760ea2de5fd65985ff510d625 0000-0002-6591-5928 Francesca De Rossi Francesca De Rossi true false 38c85534a35a03aac99b687029078831 Pete Davies Pete Davies true false a210327b52472cfe8df9b8108d661457 0000-0002-8015-1436 Trystan Watson Trystan Watson true false 4dc059714847cb22ed922ab058950560 0000-0001-9887-2007 Cecile Charbonneau Cecile Charbonneau true false 2021-10-15 MTLS Carbon perovskite solar cells (C-PSCs) are a popular photovoltaic technology currently undergoing extensive development on the global research scene. Whilst their record efficiency now rivals that of silicon PV in small-scale devices, C-PSCs still require considerable development to progress to a commercial-scale product. This study is the first of its kind to use broad beam ion milling for C-PSCs. It investigates how the carbon ink, usually optimised for maximum sheet conductivity, impacts the infiltration of the perovskite into the active layers, which in turn impacts the performance of the cells. Through the use of secondary electron microscopy with energy-dispersive X-ray spectroscopy, infiltration defects were revealed relating to carbon flake orientation. The cross sections imaged showed between a 2% and 100% inactive area within the C-PSCs due to this carbon blocking effect. The impact of these defects on the performance of solar cells is considerable, and by better understanding these defects devices can be improved for mass manufacture. Journal Article Materials 14 19 5852 MDPI AG 1996-1944 broad beam ion milling; ion milling; perovskite; SEM; EDS; mesoporous carbon stack; mesoscopic perovskite solar cell; infiltration 6 10 2021 2021-10-06 10.3390/ma14195852 COLLEGE NANME Materials Science and Engineering COLLEGE CODE MTLS Swansea University External research funder(s) paid the OA fee (includes OA grants disbursed by the Library) This research was funded by the Engineering and Physical Sciences Research Council (EPSRC) through the SPECIFIC Innovation and Knowledge Centre EP/N020863/1 2021-11-09T11:40:44.6340736 2021-10-15T12:33:33.8940270 Faculty of Science and Engineering School of Engineering and Applied Sciences - Uncategorised Tom Dunlop 0000-0002-5851-8713 1 Owen Kesteven 2 Francesca De Rossi 0000-0002-6591-5928 3 Pete Davies 4 Trystan Watson 0000-0002-8015-1436 5 Cecile Charbonneau 0000-0001-9887-2007 6 58354__21175__8e9e7693d77745a486eaf9d2a9018bbe.pdf 58354.pdf 2021-10-15T12:42:49.8305267 Output 5434759 application/pdf Version of Record true © 2021 by the authors.This is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license true eng https://creativecommons.org/licenses/by/4.0/
title Exploring the Infiltration Features of Perovskite within Mesoporous Carbon Stack Solar Cells Using Broad Beam Ion Milling
spellingShingle Exploring the Infiltration Features of Perovskite within Mesoporous Carbon Stack Solar Cells Using Broad Beam Ion Milling
Tom Dunlop
Owen Kesteven
Francesca De Rossi
Pete Davies
Trystan Watson
Cecile Charbonneau
title_short Exploring the Infiltration Features of Perovskite within Mesoporous Carbon Stack Solar Cells Using Broad Beam Ion Milling
title_full Exploring the Infiltration Features of Perovskite within Mesoporous Carbon Stack Solar Cells Using Broad Beam Ion Milling
title_fullStr Exploring the Infiltration Features of Perovskite within Mesoporous Carbon Stack Solar Cells Using Broad Beam Ion Milling
title_full_unstemmed Exploring the Infiltration Features of Perovskite within Mesoporous Carbon Stack Solar Cells Using Broad Beam Ion Milling
title_sort Exploring the Infiltration Features of Perovskite within Mesoporous Carbon Stack Solar Cells Using Broad Beam Ion Milling
author_id_str_mv 809395460ab1e6b53a906b136d919c41
95b4f4cba277b008ab8b73f52643d871
04b56f7760ea2de5fd65985ff510d625
38c85534a35a03aac99b687029078831
a210327b52472cfe8df9b8108d661457
4dc059714847cb22ed922ab058950560
author_id_fullname_str_mv 809395460ab1e6b53a906b136d919c41_***_Tom Dunlop
95b4f4cba277b008ab8b73f52643d871_***_Owen Kesteven
04b56f7760ea2de5fd65985ff510d625_***_Francesca De Rossi
38c85534a35a03aac99b687029078831_***_Pete Davies
a210327b52472cfe8df9b8108d661457_***_Trystan Watson
4dc059714847cb22ed922ab058950560_***_Cecile Charbonneau
author Tom Dunlop
Owen Kesteven
Francesca De Rossi
Pete Davies
Trystan Watson
Cecile Charbonneau
author2 Tom Dunlop
Owen Kesteven
Francesca De Rossi
Pete Davies
Trystan Watson
Cecile Charbonneau
format Journal article
container_title Materials
container_volume 14
container_issue 19
container_start_page 5852
publishDate 2021
institution Swansea University
issn 1996-1944
doi_str_mv 10.3390/ma14195852
publisher MDPI AG
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Uncategorised{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Uncategorised
document_store_str 1
active_str 0
description Carbon perovskite solar cells (C-PSCs) are a popular photovoltaic technology currently undergoing extensive development on the global research scene. Whilst their record efficiency now rivals that of silicon PV in small-scale devices, C-PSCs still require considerable development to progress to a commercial-scale product. This study is the first of its kind to use broad beam ion milling for C-PSCs. It investigates how the carbon ink, usually optimised for maximum sheet conductivity, impacts the infiltration of the perovskite into the active layers, which in turn impacts the performance of the cells. Through the use of secondary electron microscopy with energy-dispersive X-ray spectroscopy, infiltration defects were revealed relating to carbon flake orientation. The cross sections imaged showed between a 2% and 100% inactive area within the C-PSCs due to this carbon blocking effect. The impact of these defects on the performance of solar cells is considerable, and by better understanding these defects devices can be improved for mass manufacture.
published_date 2021-10-06T04:14:49Z
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score 11.036531

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