Journal article 1116 views
Atomic force microscopy and scanning tunneling microscopy-spectroscopy characterization of ZnO nanobelts
Christopher Wright 
,
Steve Wilks,
Thierry Maffeis ,
Rowan Brown
,
Steve Wilks,
Thierry Maffeis ,
Rowan Brown
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Swansea University Authors:
Christopher Wright , Steve Wilks, Thierry Maffeis , Rowan Brown
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DOI (Published version): 10.1116/1.2838048
Abstract
Atomic force microscopy and scanning tunneling microscopy-spectroscopy characterization of ZnO nanobelts
| Published in: | Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures |
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| Published: |
2008
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa5469 |
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| College: |
Faculty of Science and Engineering |
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