Wright, C., Wilks, S., Maffeis, T., & Brown, R. (2008). Atomic force microscopy and scanning tunneling microscopy-spectroscopy characterization of ZnO nanobelts. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. doi:10.1116/1.2838048
Chicago Style CitationWright, Christopher, Steve Wilks, Thierry Maffeis, and Rowan Brown. "Atomic Force Microscopy and Scanning Tunneling Microscopy-spectroscopy Characterization of ZnO Nanobelts." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2008.
MLA CitationWright, Christopher, Steve Wilks, Thierry Maffeis, and Rowan Brown. "Atomic Force Microscopy and Scanning Tunneling Microscopy-spectroscopy Characterization of ZnO Nanobelts." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2008.