Journal article 616 views
Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy
J. L. Plaza,
S. Jacke,
Y. Chen,
R. E. Palmer,
Richard Palmer 
Philosophical Magazine, Volume: 83, Issue: 9, Pages: 1137 - 1142
Swansea University Author:
Richard Palmer
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1080/0141861031000072006
Abstract
Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy
| Published in: | Philosophical Magazine |
|---|---|
| ISSN: | 1478-6435 1478-6443 |
| Published: |
2003
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa49391 |
| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
9 |
| Start Page: |
1137 |
| End Page: |
1142 |