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Characterization of stability of benchmark organic photovoltaic films after proton and electron bombardments
Jérémy Barbé,
Harrison K. H. Lee,
Hiroyuki Toyota,
Kazuyuki Hirose,
Shin-ichiro Sato,
Takeshi Ohshima,
Keith C. Heasman,
Wing C. Tsoi,
Wing Chung Tsoi
Applied Physics Letters, Volume: 113, Issue: 18, Start page: 183301
Swansea University Author: Wing Chung Tsoi
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DOI (Published version): 10.1063/1.5046829
Abstract
Organic solar cells have attractive potential for space applications as they have very high specific power (power generated per weight) and ultra-high flexibility (to reduce stowed volume). However, one critical issue is whether they are stable under the harsh space environment, particularly their s...
Published in: | Applied Physics Letters |
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ISSN: | 0003-6951 1077-3118 |
Published: |
2018
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Online Access: |
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URI: | https://cronfa.swan.ac.uk/Record/cronfa45298 |
Abstract: |
Organic solar cells have attractive potential for space applications as they have very high specific power (power generated per weight) and ultra-high flexibility (to reduce stowed volume). However, one critical issue is whether they are stable under the harsh space environment, particularly their stability under high energy, high flux, electron and proton bombardment. In this paper, the stability of benchmark organic photovoltaic layers under proton bombardment (150 keV with a fluence of 1 × 1012/cm2) and electron bombardment (1 MeV with a fluence of 1 × 1013/cm2) under vacuum is investigated. Raman spectroscopy, photoluminescence spectroscopy, and optical reflectance spectroscopy are applied to study their chemical/structural, photo-chemical/morphological, and optical stability after the bombardments. The results show that all the benchmark organic photovoltaic films are stable under the radiation, implying that organic solar cells could be feasible for space applications. |
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Keywords: |
Raman spectroscopy, Solar cells, Organic semiconductors, Reflectance spectroscopy, Photoluminescence spectroscopy |
College: |
Faculty of Science and Engineering |
Issue: |
18 |
Start Page: |
183301 |