Tsoi, W. C., Barbé, J., Lee, H. K. H., Toyota, H., Hirose, K., Sato, S., . . . Tsoi, W. C. (2018). Characterization of stability of benchmark organic photovoltaic films after proton and electron bombardments. Applied Physics Letters, 113(18), p. 183301. doi:10.1063/1.5046829

Tsoi, Wing Chung, Jérémy Barbé, Harrison K. H. Lee, Hiroyuki Toyota, Kazuyuki Hirose, Shin-ichiro Sato, Takeshi Ohshima, Keith C. Heasman, and Wing C. Tsoi. "Characterization of Stability of Benchmark Organic Photovoltaic Films After Proton and Electron Bombardments." Applied Physics Letters 113, no. 18 (2018): 183301.

Tsoi, Wing Chung, et al. "Characterization of Stability of Benchmark Organic Photovoltaic Films After Proton and Electron Bombardments." Applied Physics Letters 113.18 (2018): 183301.