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Defect passivation of transition metal dichalcogenides via a charge transfer van der Waals interface
Science Advances, Volume: 3, Issue: 10, Start page: e1701661
Swansea University Author: Yuzheng Guo
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DOI (Published version): 10.1126/sciadv.1701661
Abstract
Integration of transition metal dichalcogenides (TMDs) into next-generation semiconductor platforms has been limited due to a lack of effective passivation techniques for defects in TMDs. The formation of an organic-inorganic van der Waals interface between a monolayer (ML) of titanyl phthalocyanine...
Published in: | Science Advances |
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ISSN: | 2375-2548 |
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American Association for the Advancement of Science (AAAS)
2017
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URI: | https://cronfa.swan.ac.uk/Record/cronfa37808 |
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2021-09-24T14:57:10.4262028 v2 37808 2018-01-03 Defect passivation of transition metal dichalcogenides via a charge transfer van der Waals interface 2c285ab01f88f7ecb25a3aacabee52ea 0000-0003-2656-0340 Yuzheng Guo Yuzheng Guo true false 2018-01-03 ACEM Integration of transition metal dichalcogenides (TMDs) into next-generation semiconductor platforms has been limited due to a lack of effective passivation techniques for defects in TMDs. The formation of an organic-inorganic van der Waals interface between a monolayer (ML) of titanyl phthalocyanine (TiOPc) and a ML of MoS2 is investigated as a defect passivation method. A strong negative charge transfer from MoS2 to TiOPc molecules is observed in scanning tunneling microscopy. As a result of the formation of a van der Waals interface, the ION/IOFF in back-gated MoS2 transistors increases by more than two orders of magnitude, whereas the degradation in the photoluminescence signal is suppressed. Density functional theory modeling reveals a van der Waals interaction that allows sufficient charge transfer to remove defect states in MoS2. The present organic-TMD interface is a model system to control the surface/interface states in TMDs by using charge transfer to a van der Waals bonded complex. Journal Article Science Advances 3 10 e1701661 American Association for the Advancement of Science (AAAS) 2375-2548 20 10 2017 2017-10-20 10.1126/sciadv.1701661 2019 This work has led to the author being invited to speak at MRS spring meeting. COLLEGE NANME Aerospace, Civil, Electrical, and Mechanical Engineering COLLEGE CODE ACEM Swansea University 2021-09-24T14:57:10.4262028 2018-01-03T10:21:01.2881386 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - General Engineering Jun Hong Park 1 Atresh Sanne 2 Yuzheng Guo 0000-0003-2656-0340 3 Matin Amani 4 Kehao Zhang 5 Hema C. P. Movva 6 Joshua A. Robinson 7 Ali Javey 8 John Robertson 9 Sanjay K. Banerjee 10 Andrew C. Kummel 11 0037808-03012018102421.pdf park2017.pdf 2018-01-03T10:24:21.4870000 Output 3284963 application/pdf Version of Record true © 2017 The Authors. All article content, except where otherwise noted, is licensed under a Creative Commons Attribution NonCommercial License 4.0 true eng http://creativecommons.org/licenses/by-nc/4.0/ |
title |
Defect passivation of transition metal dichalcogenides via a charge transfer van der Waals interface |
spellingShingle |
Defect passivation of transition metal dichalcogenides via a charge transfer van der Waals interface Yuzheng Guo |
title_short |
Defect passivation of transition metal dichalcogenides via a charge transfer van der Waals interface |
title_full |
Defect passivation of transition metal dichalcogenides via a charge transfer van der Waals interface |
title_fullStr |
Defect passivation of transition metal dichalcogenides via a charge transfer van der Waals interface |
title_full_unstemmed |
Defect passivation of transition metal dichalcogenides via a charge transfer van der Waals interface |
title_sort |
Defect passivation of transition metal dichalcogenides via a charge transfer van der Waals interface |
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2c285ab01f88f7ecb25a3aacabee52ea |
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2c285ab01f88f7ecb25a3aacabee52ea_***_Yuzheng Guo |
author |
Yuzheng Guo |
author2 |
Jun Hong Park Atresh Sanne Yuzheng Guo Matin Amani Kehao Zhang Hema C. P. Movva Joshua A. Robinson Ali Javey John Robertson Sanjay K. Banerjee Andrew C. Kummel |
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10.1126/sciadv.1701661 |
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American Association for the Advancement of Science (AAAS) |
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description |
Integration of transition metal dichalcogenides (TMDs) into next-generation semiconductor platforms has been limited due to a lack of effective passivation techniques for defects in TMDs. The formation of an organic-inorganic van der Waals interface between a monolayer (ML) of titanyl phthalocyanine (TiOPc) and a ML of MoS2 is investigated as a defect passivation method. A strong negative charge transfer from MoS2 to TiOPc molecules is observed in scanning tunneling microscopy. As a result of the formation of a van der Waals interface, the ION/IOFF in back-gated MoS2 transistors increases by more than two orders of magnitude, whereas the degradation in the photoluminescence signal is suppressed. Density functional theory modeling reveals a van der Waals interaction that allows sufficient charge transfer to remove defect states in MoS2. The present organic-TMD interface is a model system to control the surface/interface states in TMDs by using charge transfer to a van der Waals bonded complex. |
published_date |
2017-10-20T13:22:33Z |
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1821321307856306176 |
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11.132912 |