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Imaging surfaces of nano-scale roughness by atomic force microscopy with carbon nanotubes as tips: a comparative study

Martin Munz, Jae-Ho Kim, Oliver Krause, Deb Roy Orcid Logo

Surface and Interface Analysis, Volume: 43, Issue: 11, Pages: 1382 - 1391

Swansea University Author: Deb Roy Orcid Logo

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DOI (Published version): 10.1002/sia.3727

Published in: Surface and Interface Analysis
ISSN: 01422421
Published: 2011
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URI: https://cronfa.swan.ac.uk/Record/cronfa37226
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College: Faculty of Science and Engineering
Issue: 11
Start Page: 1382
End Page: 1391