Roy, D., Munz, M., Kim, J., & Krause, O. (2011). Imaging surfaces of nano-scale roughness by atomic force microscopy with carbon nanotubes as tips: A comparative study. Surface and Interface Analysis, 43(11), pp. 1382-1391. doi:10.1002/sia.3727

Roy, Deb, Martin Munz, Jae-Ho Kim, and Oliver Krause. "Imaging Surfaces of Nano-scale Roughness By Atomic Force Microscopy With Carbon Nanotubes As Tips: A Comparative Study." Surface and Interface Analysis 43, no. 11 (2011): 1382-1391.

Roy, Deb, Martin Munz, Jae-Ho Kim, and Oliver Krause. "Imaging Surfaces of Nano-scale Roughness By Atomic Force Microscopy With Carbon Nanotubes As Tips: A Comparative Study." Surface and Interface Analysis 43.11 (2011): 1382-1391.