Journal article 913 views
Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy
Weitao Su,
Naresh Kumar,
Ning Dai,
Deb Roy 
Chemical Communications, Volume: 52, Issue: 53, Pages: 8227 - 8230
Swansea University Author:
Deb Roy
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1039/c6cc01990k
Abstract
Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy
| Published in: | Chemical Communications |
|---|---|
| ISSN: | 1359-7345 1364-548X |
| Published: |
Royal Society of Chemistry (RSC)
2016
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa37209 |
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| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
53 |
| Start Page: |
8227 |
| End Page: |
8230 |