Roy, D., Su, W., Kumar, N., & Dai, N. (2016). Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy. Chemical Communications, 52(53), pp. 8227-8230. doi:10.1039/c6cc01990k
Chicago Style CitationRoy, Deb, Weitao Su, Naresh Kumar, and Ning Dai. "Nanoscale Mapping of Intrinsic Defects in Single-layer Graphene Using Tip-enhanced Raman Spectroscopy." Chemical Communications 52, no. 53 (2016): 8227-8230.
MLA CitationRoy, Deb, Weitao Su, Naresh Kumar, and Ning Dai. "Nanoscale Mapping of Intrinsic Defects in Single-layer Graphene Using Tip-enhanced Raman Spectroscopy." Chemical Communications 52.53 (2016): 8227-8230.
Warning: These citations may not always be 100% accurate.