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Complications pertaining to the detection and characterization of individual and embedded single walled carbon nanotubes by scanning electron microscopy

A.W. Orbaek, A.R. Barron, Alvin Orbaek White Orcid Logo

Nanoscale, Volume: 5, Issue: 7, Start page: 2790

Swansea University Author: Alvin Orbaek White Orcid Logo

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DOI (Published version): 10.1039/c3nr00142c

Abstract

Comparison of AFM and SEM images of single walled carbon nanotubes (SWNTs) grown within a dielectric matrix reveal subterranean nanotubes that are present within the matrix, and as such can be charge screened by the dielectric. Under adequate imaging conditions for the SWNT/silica sample the intensi...

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Published in: Nanoscale
ISSN: 2040-3364 2040-3372
Published: 2013
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URI: https://cronfa.swan.ac.uk/Record/cronfa32803
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spelling 2017-03-31T12:19:35.8343985 v2 32803 2017-03-29 Complications pertaining to the detection and characterization of individual and embedded single walled carbon nanotubes by scanning electron microscopy 8414a23650d4403fdfe1a735dbd2e24e 0000-0001-6338-5970 Alvin Orbaek White Alvin Orbaek White true false 2017-03-29 CHEG Comparison of AFM and SEM images of single walled carbon nanotubes (SWNTs) grown within a dielectric matrix reveal subterranean nanotubes that are present within the matrix, and as such can be charge screened by the dielectric. Under adequate imaging conditions for the SWNT/silica sample the intensity of isolated nanotubes is found to be inversely proportional to the instrument dwell time (i.e., shorter dwell times were found to make SWNT intensities brighter). The threshold dwell time required to enable isolated tubes to be visible was found to be 10 μs; moreover, the degree change in intensity was found to be nanotube specific, i.e., different SWNTs respond in a different manner at different dwell times. The results indicate that care should be taken when attempting to quantify number density and length distributions of SWNTs on or within a dielectric matrix. Journal Article Nanoscale 5 7 2790 2040-3364 2040-3372 31 12 2013 2013-12-31 10.1039/c3nr00142c http://www.scopus.com/inward/record.url?eid=2-s2.0-84893597488&amp;partnerID=MN8TOARS COLLEGE NANME Chemical Engineering COLLEGE CODE CHEG Swansea University 2017-03-31T12:19:35.8343985 2017-03-29T14:46:39.2713600 Faculty of Science and Engineering School of Engineering and Applied Sciences - Chemical Engineering A.W. Orbaek 1 A.R. Barron 2 Alvin Orbaek White 0000-0001-6338-5970 3
title Complications pertaining to the detection and characterization of individual and embedded single walled carbon nanotubes by scanning electron microscopy
spellingShingle Complications pertaining to the detection and characterization of individual and embedded single walled carbon nanotubes by scanning electron microscopy
Alvin Orbaek White
title_short Complications pertaining to the detection and characterization of individual and embedded single walled carbon nanotubes by scanning electron microscopy
title_full Complications pertaining to the detection and characterization of individual and embedded single walled carbon nanotubes by scanning electron microscopy
title_fullStr Complications pertaining to the detection and characterization of individual and embedded single walled carbon nanotubes by scanning electron microscopy
title_full_unstemmed Complications pertaining to the detection and characterization of individual and embedded single walled carbon nanotubes by scanning electron microscopy
title_sort Complications pertaining to the detection and characterization of individual and embedded single walled carbon nanotubes by scanning electron microscopy
author_id_str_mv 8414a23650d4403fdfe1a735dbd2e24e
author_id_fullname_str_mv 8414a23650d4403fdfe1a735dbd2e24e_***_Alvin Orbaek White
author Alvin Orbaek White
author2 A.W. Orbaek
A.R. Barron
Alvin Orbaek White
format Journal article
container_title Nanoscale
container_volume 5
container_issue 7
container_start_page 2790
publishDate 2013
institution Swansea University
issn 2040-3364
2040-3372
doi_str_mv 10.1039/c3nr00142c
college_str Faculty of Science and Engineering
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hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Chemical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Chemical Engineering
url http://www.scopus.com/inward/record.url?eid=2-s2.0-84893597488&amp;partnerID=MN8TOARS
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description Comparison of AFM and SEM images of single walled carbon nanotubes (SWNTs) grown within a dielectric matrix reveal subterranean nanotubes that are present within the matrix, and as such can be charge screened by the dielectric. Under adequate imaging conditions for the SWNT/silica sample the intensity of isolated nanotubes is found to be inversely proportional to the instrument dwell time (i.e., shorter dwell times were found to make SWNT intensities brighter). The threshold dwell time required to enable isolated tubes to be visible was found to be 10 μs; moreover, the degree change in intensity was found to be nanotube specific, i.e., different SWNTs respond in a different manner at different dwell times. The results indicate that care should be taken when attempting to quantify number density and length distributions of SWNTs on or within a dielectric matrix.
published_date 2013-12-31T03:40:19Z
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score 11.037603

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