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Conference Paper/Proceeding/Abstract 823 views

Scanning Probe Microscopy using Higher-Mode Electrostatically-Actuated Microcantilevers

D.R. Sahoo, V. Kartik, A. Sebastian, H. Pozidis, Deepak Sahoo Orcid Logo

IFAC Proceedings Volumes, Volume: 43, Issue: 18, Pages: 212 - 219

Swansea University Author: Deepak Sahoo Orcid Logo

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DOI (Published version): 10.3182/20100913-3-US-2015.00090

Published in: IFAC Proceedings Volumes
ISSN: 14746670
Published: 2010
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URI: https://cronfa.swan.ac.uk/Record/cronfa32162
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first_indexed 2017-02-28T13:32:23Z
last_indexed 2018-02-09T05:19:47Z
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fullrecord <?xml version="1.0"?><rfc1807><datestamp>2017-02-28T09:35:18.0064853</datestamp><bib-version>v2</bib-version><id>32162</id><entry>2017-02-28</entry><title>Scanning Probe Microscopy using Higher-Mode Electrostatically-Actuated Microcantilevers</title><swanseaauthors><author><sid>c7b57876957049ac9718ff1b265fb2ce</sid><ORCID>0000-0002-4421-7549</ORCID><firstname>Deepak</firstname><surname>Sahoo</surname><name>Deepak Sahoo</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2017-02-28</date><deptcode>SCS</deptcode><abstract/><type>Conference Paper/Proceeding/Abstract</type><journal>IFAC Proceedings Volumes</journal><volume>43</volume><journalNumber>18</journalNumber><paginationStart>212</paginationStart><paginationEnd>219</paginationEnd><publisher/><issnPrint>14746670</issnPrint><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2010</publishedYear><publishedDate>2010-12-31</publishedDate><doi>10.3182/20100913-3-US-2015.00090</doi><url>http://www.scopus.com/inward/record.url?eid=2-s2.0-84901930781&amp;amp;partnerID=MN8TOARS</url><notes/><college>COLLEGE NANME</college><department>Computer Science</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>SCS</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2017-02-28T09:35:18.0064853</lastEdited><Created>2017-02-28T09:35:17.6632716</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Mathematics and Computer Science - Computer Science</level></path><authors><author><firstname>D.R.</firstname><surname>Sahoo</surname><order>1</order></author><author><firstname>V.</firstname><surname>Kartik</surname><order>2</order></author><author><firstname>A.</firstname><surname>Sebastian</surname><order>3</order></author><author><firstname>H.</firstname><surname>Pozidis</surname><order>4</order></author><author><firstname>Deepak</firstname><surname>Sahoo</surname><orcid>0000-0002-4421-7549</orcid><order>5</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2017-02-28T09:35:18.0064853 v2 32162 2017-02-28 Scanning Probe Microscopy using Higher-Mode Electrostatically-Actuated Microcantilevers c7b57876957049ac9718ff1b265fb2ce 0000-0002-4421-7549 Deepak Sahoo Deepak Sahoo true false 2017-02-28 SCS Conference Paper/Proceeding/Abstract IFAC Proceedings Volumes 43 18 212 219 14746670 31 12 2010 2010-12-31 10.3182/20100913-3-US-2015.00090 http://www.scopus.com/inward/record.url?eid=2-s2.0-84901930781&amp;partnerID=MN8TOARS COLLEGE NANME Computer Science COLLEGE CODE SCS Swansea University 2017-02-28T09:35:18.0064853 2017-02-28T09:35:17.6632716 Faculty of Science and Engineering School of Mathematics and Computer Science - Computer Science D.R. Sahoo 1 V. Kartik 2 A. Sebastian 3 H. Pozidis 4 Deepak Sahoo 0000-0002-4421-7549 5
title Scanning Probe Microscopy using Higher-Mode Electrostatically-Actuated Microcantilevers
spellingShingle Scanning Probe Microscopy using Higher-Mode Electrostatically-Actuated Microcantilevers
Deepak Sahoo
title_short Scanning Probe Microscopy using Higher-Mode Electrostatically-Actuated Microcantilevers
title_full Scanning Probe Microscopy using Higher-Mode Electrostatically-Actuated Microcantilevers
title_fullStr Scanning Probe Microscopy using Higher-Mode Electrostatically-Actuated Microcantilevers
title_full_unstemmed Scanning Probe Microscopy using Higher-Mode Electrostatically-Actuated Microcantilevers
title_sort Scanning Probe Microscopy using Higher-Mode Electrostatically-Actuated Microcantilevers
author_id_str_mv c7b57876957049ac9718ff1b265fb2ce
author_id_fullname_str_mv c7b57876957049ac9718ff1b265fb2ce_***_Deepak Sahoo
author Deepak Sahoo
author2 D.R. Sahoo
V. Kartik
A. Sebastian
H. Pozidis
Deepak Sahoo
format Conference Paper/Proceeding/Abstract
container_title IFAC Proceedings Volumes
container_volume 43
container_issue 18
container_start_page 212
publishDate 2010
institution Swansea University
issn 14746670
doi_str_mv 10.3182/20100913-3-US-2015.00090
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Mathematics and Computer Science - Computer Science{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Mathematics and Computer Science - Computer Science
url http://www.scopus.com/inward/record.url?eid=2-s2.0-84901930781&amp;partnerID=MN8TOARS
document_store_str 0
active_str 0
published_date 2010-12-31T03:39:22Z
_version_ 1763751768681873408
score 11.036684

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