Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison

Bailey, Melanie. J.; Bright, Nicholas J.; Croxton, Ruth S.; Francese, Simona; Ferguson, Leesa S.; Hinder, Stephen; Jickells, Sue; Jones, Benjamin J.; Jones, Brian N.; Kazarian, Sergei G.; Ojeda, Jesus J.; Webb, Roger P.; Wolstenholme, Rosalind; Bleay, Stephen; Ledo, Jesus Ojeda

doi:10.1021/ac302441y

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Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry,...

Melanie. J. Bailey, Nicholas J. Bright, Ruth S. Croxton, Simona Francese, Leesa S. Ferguson, Stephen Hinder, Sue Jickells, Benjamin J. Jones, Brian N. Jones, Sergei G. Kazarian, Jesus J. Ojeda, Roger P. Webb, Rosalind Wolstenholme, Stephen Bleay, Jesus Ojeda Ledo

Analytical Chemistry, Volume: 84, Issue: 20, Pages: 8514 - 8523

Swansea University Author: Jesus Ojeda Ledo

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DOI (Published version): 10.1021/ac302441y

Published in:	Analytical Chemistry
ISSN:	0003-2700 1520-6882
Published:	2012
Online Access:	Check full text
URI:	https://cronfa.swan.ac.uk/Record/cronfa24446
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first_indexed	2015-11-17T01:52:37Z
last_indexed	2018-02-09T05:04:13Z
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spelling	2015-11-16T16:49:27.9092124 v2 24446 2015-11-16 Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison 4c1c9800dffa623353dff0ab1271be64 0000-0002-2046-1010 Jesus Ojeda Ledo Jesus Ojeda Ledo true false 2015-11-16 CHEG Journal Article Analytical Chemistry 84 20 8514 8523 0003-2700 1520-6882 31 12 2012 2012-12-31 10.1021/ac302441y http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000309805200014&KeyUID=WOS:000309805200014 @articleRID:0622150816996-43,title = Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison,journal = Analytical Chemistry,year = 2012,author = Bailey, Melanie. J. and Bright, Nicholas J. and Croxton, Ruth S. and Francese, Simona and Ferguson, Leesa S. and Hinder, Stephen and Jickells, Sue and Jones, Benjamin J. and Jones, Brian N. and Kazarian, Sergei G. and Ojeda, Jesus J. and Webb, Roger P. and Wolstenholme, Rosalind and Bleay, Stephen,volume = 84,number = 20,pages = 8514-8523 COLLEGE NANME Chemical Engineering COLLEGE CODE CHEG Swansea University 2015-11-16T16:49:27.9092124 2015-11-16T16:49:27.6908110 Faculty of Science and Engineering School of Engineering and Applied Sciences - Chemical Engineering Melanie. J. Bailey 1 Nicholas J. Bright 2 Ruth S. Croxton 3 Simona Francese 4 Leesa S. Ferguson 5 Stephen Hinder 6 Sue Jickells 7 Benjamin J. Jones 8 Brian N. Jones 9 Sergei G. Kazarian 10 Jesus J. Ojeda 11 Roger P. Webb 12 Rosalind Wolstenholme 13 Stephen Bleay 14 Jesus Ojeda Ledo 0000-0002-2046-1010 15
title	Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison
spellingShingle	Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison Jesus Ojeda Ledo
title_short	Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison
title_full	Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison
title_fullStr	Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison
title_full_unstemmed	Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison
title_sort	Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison
author_id_str_mv	4c1c9800dffa623353dff0ab1271be64
author_id_fullname_str_mv	4c1c9800dffa623353dff0ab1271be64_***_Jesus Ojeda Ledo
author	Jesus Ojeda Ledo
author2	Melanie. J. Bailey Nicholas J. Bright Ruth S. Croxton Simona Francese Leesa S. Ferguson Stephen Hinder Sue Jickells Benjamin J. Jones Brian N. Jones Sergei G. Kazarian Jesus J. Ojeda Roger P. Webb Rosalind Wolstenholme Stephen Bleay Jesus Ojeda Ledo
format	Journal article
container_title	Analytical Chemistry
container_volume	84
container_issue	20
container_start_page	8514
publishDate	2012
institution	Swansea University
issn	0003-2700 1520-6882
doi_str_mv	10.1021/ac302441y
college_str	Faculty of Science and Engineering
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hierarchy_top_id	facultyofscienceandengineering
hierarchy_top_title	Faculty of Science and Engineering
hierarchy_parent_id	facultyofscienceandengineering
hierarchy_parent_title	Faculty of Science and Engineering
department_str	School of Engineering and Applied Sciences - Chemical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Chemical Engineering
url	http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000309805200014&KeyUID=WOS:000309805200014
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published_date	2012-12-31T03:28:59Z
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Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry,...

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