Journal article 1523 views
Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry,...
Analytical Chemistry, Volume: 84, Issue: 20, Pages: 8514 - 8523
Swansea University Author: Jesus Ojeda Ledo
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1021/ac302441y
Abstract
Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison
Published in: | Analytical Chemistry |
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ISSN: | 0003-2700 1520-6882 |
Published: |
2012
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Online Access: |
Check full text
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URI: | https://cronfa.swan.ac.uk/Record/cronfa24446 |
Item Description: |
@articleRID:0622150816996-43,title = Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison,journal = Analytical Chemistry,year = 2012,author = Bailey, Melanie. J. and Bright, Nicholas J. and Croxton, Ruth S. and Francese, Simona and Ferguson, Leesa S. and Hinder, Stephen and Jickells, Sue and Jones, Benjamin J. and Jones, Brian N. and Kazarian, Sergei G. and Ojeda, Jesus J. and Webb, Roger P. and Wolstenholme, Rosalind and Bleay, Stephen,volume = 84,number = 20,pages = 8514-8523 |
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College: |
Faculty of Science and Engineering |
Issue: |
20 |
Start Page: |
8514 |
End Page: |
8523 |