Journal article 1649 views 227 downloads
The effects of surface stripping ZnO nanorods with argon bombardment
Nanotechnology, Volume: 26, Issue: 41, Start page: 415701
Swansea University Authors: Thierry Maffeis , Richard Cobley
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DOI (Published version): 10.1088/0957-4484/26/41/415701
Abstract
ZnO nanorods are used in devices including field effects transistors, piezoelectric transducers, optoelectronics and gas sensors. However, for efficient and reproducible device operation and contact behaviour, surface contaminants must be removed or controlled. Here we use low doses of argon bombard...
Published in: | Nanotechnology |
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ISSN: | 0957-4484 1361-6528 |
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2015
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URI: | https://cronfa.swan.ac.uk/Record/cronfa23525 |
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2018-04-30T19:11:15Z |
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2018-04-30T14:26:12.3884466 v2 23525 2015-10-01 The effects of surface stripping ZnO nanorods with argon bombardment 992eb4cb18b61c0cd3da6e0215ac787c 0000-0003-2357-0092 Thierry Maffeis Thierry Maffeis true false 2ce7e1dd9006164425415a35fa452494 0000-0003-4833-8492 Richard Cobley Richard Cobley true false 2015-10-01 ACEM ZnO nanorods are used in devices including field effects transistors, piezoelectric transducers, optoelectronics and gas sensors. However, for efficient and reproducible device operation and contact behaviour, surface contaminants must be removed or controlled. Here we use low doses of argon bombardment to remove surface contamination and make reproducible lower resistance contacts. Higher doses strip the surface of the nanorods allowing intrinsic surface measurements through a cross section of the material. Photoluminescence finds that the defect distribution is higher at the near-surface, falling away in to the bulk. Contacts to the n-type defect-rich surface are near-Ohmic, whereas stripping away the surface layers allows more rectifying Schottky contacts to be formed. The ability to select the contact type to ZnO nanorods offers a new way to customize device behaviour. Journal Article Nanotechnology 26 41 415701 0957-4484 1361-6528 ZnO, Argon bombardment, Ohmic, Schottky, Contacts 22 9 2015 2015-09-22 10.1088/0957-4484/26/41/415701 Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. COLLEGE NANME Aerospace, Civil, Electrical, and Mechanical Engineering COLLEGE CODE ACEM Swansea University 2018-04-30T14:26:12.3884466 2015-10-01T13:43:34.8173839 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering Chris J Barnett 1 Olga Kryvchenkova 2 Nathan A Smith 3 Liam Kelleher 4 Thierry Maffeis 0000-0003-2357-0092 5 Richard Cobley 0000-0003-4833-8492 6 0023525-15072016124454.pdf Barnett2015.pdf 2016-07-15T12:44:54.5470000 Output 427536 application/pdf Version of Record true 2016-07-15T00:00:00.0000000 false |
title |
The effects of surface stripping ZnO nanorods with argon bombardment |
spellingShingle |
The effects of surface stripping ZnO nanorods with argon bombardment Thierry Maffeis Richard Cobley |
title_short |
The effects of surface stripping ZnO nanorods with argon bombardment |
title_full |
The effects of surface stripping ZnO nanorods with argon bombardment |
title_fullStr |
The effects of surface stripping ZnO nanorods with argon bombardment |
title_full_unstemmed |
The effects of surface stripping ZnO nanorods with argon bombardment |
title_sort |
The effects of surface stripping ZnO nanorods with argon bombardment |
author_id_str_mv |
992eb4cb18b61c0cd3da6e0215ac787c 2ce7e1dd9006164425415a35fa452494 |
author_id_fullname_str_mv |
992eb4cb18b61c0cd3da6e0215ac787c_***_Thierry Maffeis 2ce7e1dd9006164425415a35fa452494_***_Richard Cobley |
author |
Thierry Maffeis Richard Cobley |
author2 |
Chris J Barnett Olga Kryvchenkova Nathan A Smith Liam Kelleher Thierry Maffeis Richard Cobley |
format |
Journal article |
container_title |
Nanotechnology |
container_volume |
26 |
container_issue |
41 |
container_start_page |
415701 |
publishDate |
2015 |
institution |
Swansea University |
issn |
0957-4484 1361-6528 |
doi_str_mv |
10.1088/0957-4484/26/41/415701 |
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Faculty of Science and Engineering |
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facultyofscienceandengineering |
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Faculty of Science and Engineering |
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facultyofscienceandengineering |
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Faculty of Science and Engineering |
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School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering |
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description |
ZnO nanorods are used in devices including field effects transistors, piezoelectric transducers, optoelectronics and gas sensors. However, for efficient and reproducible device operation and contact behaviour, surface contaminants must be removed or controlled. Here we use low doses of argon bombardment to remove surface contamination and make reproducible lower resistance contacts. Higher doses strip the surface of the nanorods allowing intrinsic surface measurements through a cross section of the material. Photoluminescence finds that the defect distribution is higher at the near-surface, falling away in to the bulk. Contacts to the n-type defect-rich surface are near-Ohmic, whereas stripping away the surface layers allows more rectifying Schottky contacts to be formed. The ability to select the contact type to ZnO nanorods offers a new way to customize device behaviour. |
published_date |
2015-09-22T06:43:33Z |
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1821296205006635008 |
score |
11.047306 |