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Forming reproducible non-lithographic nanocontacts to assess the effect of contact compressive strain in nanomaterials

Nathan A Smith, Alex Lord Orcid Logo, Jon E Evans, Chris J Barnett, Richard Cobley Orcid Logo, S P Wilks

Semiconductor Science and Technology, Volume: 30, Issue: 6, Start page: 065011

Swansea University Authors: Alex Lord Orcid Logo, Richard Cobley Orcid Logo

DOI (Published version): 10.1088/0268-1242/30/6/065011

Abstract

The application of electrical nanoprobes to measure and characterize nanomaterials has become widely spread. However, the formation of quality electrical contacts using metallic probes on nanostructures has not been directly assessed. We investigate here the electrical behaviour of non-lithographica...

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Published in: Semiconductor Science and Technology
Published: 2015
URI: https://cronfa.swan.ac.uk/Record/cronfa23335
first_indexed 2015-09-18T02:08:49Z
last_indexed 2019-05-31T22:19:03Z
id cronfa23335
recordtype SURis
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spelling 2019-05-30T11:30:43.6182077 v2 23335 2015-09-17 Forming reproducible non-lithographic nanocontacts to assess the effect of contact compressive strain in nanomaterials d547bad707e12f5a9f12d4fcbeea87ed 0000-0002-6258-2187 Alex Lord Alex Lord true false 2ce7e1dd9006164425415a35fa452494 0000-0003-4833-8492 Richard Cobley Richard Cobley true false 2015-09-17 The application of electrical nanoprobes to measure and characterize nanomaterials has become widely spread. However, the formation of quality electrical contacts using metallic probes on nanostructures has not been directly assessed. We investigate here the electrical behaviour of non-lithographically formed contacts to ZnO nanowires (NWs) and develop a method to reproducibly form Ohmic contacts for accurate electrical measurement of the nanostructures. The contacting method used in this work relies on an electrical feedback mechanism to determine the point of contact to the individual NWs, ensuring minimal compressive strain at the contact. This developed method is compared with the standard tip deflection contacting technique and shows a significant improvement in reproducibility. The effect of excessive compressive strain at the contact was investigated, with a change from rectifying to ohmic I–V behaviour observed as compressive strain at the contact was increased, leading to irreversible changes to the electrical properties of the NW. This work provides an ideal method for forming reproducible non-lithographic nanocontacts to a multitude of nanomaterials. Journal Article Semiconductor Science and Technology 30 6 065011 18 5 2015 2015-05-18 10.1088/0268-1242/30/6/065011 COLLEGE NANME COLLEGE CODE Swansea University 2019-05-30T11:30:43.6182077 2015-09-17T10:06:47.5951183 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering Nathan A Smith 1 Alex Lord 0000-0002-6258-2187 2 Jon E Evans 3 Chris J Barnett 4 Richard Cobley 0000-0003-4833-8492 5 S P Wilks 6 0023335-22092015094607.pdf Nanocontact-paper-V4.pdf 2015-09-22T09:46:07.7400000 Output 862647 application/pdf Accepted Manuscript true 2015-09-22T00:00:00.0000000 true
title Forming reproducible non-lithographic nanocontacts to assess the effect of contact compressive strain in nanomaterials
spellingShingle Forming reproducible non-lithographic nanocontacts to assess the effect of contact compressive strain in nanomaterials
Alex Lord
Richard Cobley
title_short Forming reproducible non-lithographic nanocontacts to assess the effect of contact compressive strain in nanomaterials
title_full Forming reproducible non-lithographic nanocontacts to assess the effect of contact compressive strain in nanomaterials
title_fullStr Forming reproducible non-lithographic nanocontacts to assess the effect of contact compressive strain in nanomaterials
title_full_unstemmed Forming reproducible non-lithographic nanocontacts to assess the effect of contact compressive strain in nanomaterials
title_sort Forming reproducible non-lithographic nanocontacts to assess the effect of contact compressive strain in nanomaterials
author_id_str_mv d547bad707e12f5a9f12d4fcbeea87ed
2ce7e1dd9006164425415a35fa452494
author_id_fullname_str_mv d547bad707e12f5a9f12d4fcbeea87ed_***_Alex Lord
2ce7e1dd9006164425415a35fa452494_***_Richard Cobley
author Alex Lord
Richard Cobley
author2 Nathan A Smith
Alex Lord
Jon E Evans
Chris J Barnett
Richard Cobley
S P Wilks
format Journal article
container_title Semiconductor Science and Technology
container_volume 30
container_issue 6
container_start_page 065011
publishDate 2015
institution Swansea University
doi_str_mv 10.1088/0268-1242/30/6/065011
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
document_store_str 1
active_str 0
description The application of electrical nanoprobes to measure and characterize nanomaterials has become widely spread. However, the formation of quality electrical contacts using metallic probes on nanostructures has not been directly assessed. We investigate here the electrical behaviour of non-lithographically formed contacts to ZnO nanowires (NWs) and develop a method to reproducibly form Ohmic contacts for accurate electrical measurement of the nanostructures. The contacting method used in this work relies on an electrical feedback mechanism to determine the point of contact to the individual NWs, ensuring minimal compressive strain at the contact. This developed method is compared with the standard tip deflection contacting technique and shows a significant improvement in reproducibility. The effect of excessive compressive strain at the contact was investigated, with a change from rectifying to ohmic I–V behaviour observed as compressive strain at the contact was increased, leading to irreversible changes to the electrical properties of the NW. This work provides an ideal method for forming reproducible non-lithographic nanocontacts to a multitude of nanomaterials.
published_date 2015-05-18T06:45:32Z
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score 11.064479

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