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The Current Crowding Effect in ZnO Nanowires with a Metal Contact

O. Kryvchenkova, R.J. Cobley, K. Kalna, Richard Cobley Orcid Logo, Karol Kalna Orcid Logo

Materials Today: Proceedings, Volume: 2, Issue: 1, Pages: 309 - 314

Swansea University Authors: Richard Cobley Orcid Logo, Karol Kalna Orcid Logo

DOI (Published version): 10.1016/j.matpr.2015.04.052

Abstract

Nanoscale electron tunneling and thermionic transport via the metal-semiconductor interface of ZnO nanowires is found to be strongly affected by the metal contact shape, the metal-semiconductor interface radius and the nanowire radius. Our full 3D simulations show that the current crowding effect oc...

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Published in: Materials Today: Proceedings
Published: 2015
URI: https://cronfa.swan.ac.uk/Record/cronfa23333
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Abstract: Nanoscale electron tunneling and thermionic transport via the metal-semiconductor interface of ZnO nanowires is found to be strongly affected by the metal contact shape, the metal-semiconductor interface radius and the nanowire radius. Our full 3D simulations show that the current crowding effect occurs for end-bonded contacts due to the geometry variation in the case of Schottky Au-ZnO nanowire interfaces. The change in the geometry will also lead to a change in the electrical behavior of the contact from Schottky to Ohmic which can substantially reduce the contact resistance.
Keywords: Current crowding, ZnO, simulation
College: Faculty of Science and Engineering
Issue: 1
Start Page: 309
End Page: 314