No Cover Image

Journal article 1276 views 250 downloads

The Current Crowding Effect in ZnO Nanowires with a Metal Contact

O. Kryvchenkova, R.J. Cobley, K. Kalna, Richard Cobley Orcid Logo, Karol Kalna Orcid Logo

Materials Today: Proceedings, Volume: 2, Issue: 1, Pages: 309 - 314

Swansea University Authors: Richard Cobley Orcid Logo, Karol Kalna Orcid Logo

DOI (Published version): 10.1016/j.matpr.2015.04.052

Abstract

Nanoscale electron tunneling and thermionic transport via the metal-semiconductor interface of ZnO nanowires is found to be strongly affected by the metal contact shape, the metal-semiconductor interface radius and the nanowire radius. Our full 3D simulations show that the current crowding effect oc...

Full description

Published in: Materials Today: Proceedings
Published: 2015
URI: https://cronfa.swan.ac.uk/Record/cronfa23333
Tags: Add Tag
No Tags, Be the first to tag this record!
first_indexed 2015-09-18T02:08:49Z
last_indexed 2019-05-31T22:19:03Z
id cronfa23333
recordtype SURis
fullrecord <?xml version="1.0"?><rfc1807><datestamp>2019-05-30T11:38:58.1667551</datestamp><bib-version>v2</bib-version><id>23333</id><entry>2015-09-17</entry><title>The Current Crowding Effect in ZnO Nanowires with a Metal Contact</title><swanseaauthors><author><sid>2ce7e1dd9006164425415a35fa452494</sid><ORCID>0000-0003-4833-8492</ORCID><firstname>Richard</firstname><surname>Cobley</surname><name>Richard Cobley</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>1329a42020e44fdd13de2f20d5143253</sid><ORCID>0000-0002-6333-9189</ORCID><firstname>Karol</firstname><surname>Kalna</surname><name>Karol Kalna</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2015-09-17</date><deptcode>EEEG</deptcode><abstract>Nanoscale electron tunneling and thermionic transport via the metal-semiconductor interface of ZnO nanowires is found to be strongly affected by the metal contact shape, the metal-semiconductor interface radius and the nanowire radius. Our full 3D simulations show that the current crowding effect occurs for end-bonded contacts due to the geometry variation in the case of Schottky Au-ZnO nanowire interfaces. The change in the geometry will also lead to a change in the electrical behavior of the contact from Schottky to Ohmic which can substantially reduce the contact resistance.</abstract><type>Journal Article</type><journal>Materials Today: Proceedings</journal><volume>2</volume><journalNumber>1</journalNumber><paginationStart>309</paginationStart><paginationEnd>314</paginationEnd><publisher/><keywords>Current crowding, ZnO, simulation</keywords><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2015</publishedYear><publishedDate>2015-12-31</publishedDate><doi>10.1016/j.matpr.2015.04.052</doi><url/><notes></notes><college>COLLEGE NANME</college><department>Electronic and Electrical Engineering</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>EEEG</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2019-05-30T11:38:58.1667551</lastEdited><Created>2015-09-17T09:51:28.9832298</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering</level></path><authors><author><firstname>O.</firstname><surname>Kryvchenkova</surname><order>1</order></author><author><firstname>R.J.</firstname><surname>Cobley</surname><order>2</order></author><author><firstname>K.</firstname><surname>Kalna</surname><order>3</order></author><author><firstname>Richard</firstname><surname>Cobley</surname><orcid>0000-0003-4833-8492</orcid><order>4</order></author><author><firstname>Karol</firstname><surname>Kalna</surname><orcid>0000-0002-6333-9189</orcid><order>5</order></author></authors><documents><document><filename>0023333-17092015095830.pdf</filename><originalFilename>preprint.pdf</originalFilename><uploaded>2015-09-17T09:58:30.9030000</uploaded><type>Output</type><contentLength>793492</contentLength><contentType>application/pdf</contentType><version>Accepted Manuscript</version><cronfaStatus>true</cronfaStatus><embargoDate>2015-09-17T00:00:00.0000000</embargoDate><documentNotes/><copyrightCorrect>true</copyrightCorrect></document></documents><OutputDurs/></rfc1807>
spelling 2019-05-30T11:38:58.1667551 v2 23333 2015-09-17 The Current Crowding Effect in ZnO Nanowires with a Metal Contact 2ce7e1dd9006164425415a35fa452494 0000-0003-4833-8492 Richard Cobley Richard Cobley true false 1329a42020e44fdd13de2f20d5143253 0000-0002-6333-9189 Karol Kalna Karol Kalna true false 2015-09-17 EEEG Nanoscale electron tunneling and thermionic transport via the metal-semiconductor interface of ZnO nanowires is found to be strongly affected by the metal contact shape, the metal-semiconductor interface radius and the nanowire radius. Our full 3D simulations show that the current crowding effect occurs for end-bonded contacts due to the geometry variation in the case of Schottky Au-ZnO nanowire interfaces. The change in the geometry will also lead to a change in the electrical behavior of the contact from Schottky to Ohmic which can substantially reduce the contact resistance. Journal Article Materials Today: Proceedings 2 1 309 314 Current crowding, ZnO, simulation 31 12 2015 2015-12-31 10.1016/j.matpr.2015.04.052 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2019-05-30T11:38:58.1667551 2015-09-17T09:51:28.9832298 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering O. Kryvchenkova 1 R.J. Cobley 2 K. Kalna 3 Richard Cobley 0000-0003-4833-8492 4 Karol Kalna 0000-0002-6333-9189 5 0023333-17092015095830.pdf preprint.pdf 2015-09-17T09:58:30.9030000 Output 793492 application/pdf Accepted Manuscript true 2015-09-17T00:00:00.0000000 true
title The Current Crowding Effect in ZnO Nanowires with a Metal Contact
spellingShingle The Current Crowding Effect in ZnO Nanowires with a Metal Contact
Richard Cobley
Karol Kalna
title_short The Current Crowding Effect in ZnO Nanowires with a Metal Contact
title_full The Current Crowding Effect in ZnO Nanowires with a Metal Contact
title_fullStr The Current Crowding Effect in ZnO Nanowires with a Metal Contact
title_full_unstemmed The Current Crowding Effect in ZnO Nanowires with a Metal Contact
title_sort The Current Crowding Effect in ZnO Nanowires with a Metal Contact
author_id_str_mv 2ce7e1dd9006164425415a35fa452494
1329a42020e44fdd13de2f20d5143253
author_id_fullname_str_mv 2ce7e1dd9006164425415a35fa452494_***_Richard Cobley
1329a42020e44fdd13de2f20d5143253_***_Karol Kalna
author Richard Cobley
Karol Kalna
author2 O. Kryvchenkova
R.J. Cobley
K. Kalna
Richard Cobley
Karol Kalna
format Journal article
container_title Materials Today: Proceedings
container_volume 2
container_issue 1
container_start_page 309
publishDate 2015
institution Swansea University
doi_str_mv 10.1016/j.matpr.2015.04.052
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
document_store_str 1
active_str 0
description Nanoscale electron tunneling and thermionic transport via the metal-semiconductor interface of ZnO nanowires is found to be strongly affected by the metal contact shape, the metal-semiconductor interface radius and the nanowire radius. Our full 3D simulations show that the current crowding effect occurs for end-bonded contacts due to the geometry variation in the case of Schottky Au-ZnO nanowire interfaces. The change in the geometry will also lead to a change in the electrical behavior of the contact from Schottky to Ohmic which can substantially reduce the contact resistance.
published_date 2015-12-31T03:27:31Z
_version_ 1763751023572156416
score 11.013148