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STM and XPS characterisation of vacuum annealed nanocrystalline WO3 films

T.G.G Maffeis, D Yung, L LePennec, M.W Penny, R.J Cobley, E Comini, G Sberveglieri, S.P Wilks, Richard Cobley Orcid Logo

Surface Science, Volume: 604, Start page: 4953

Swansea University Author: Richard Cobley Orcid Logo

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DOI (Published version): 10.1016/j.susc.2007.08.009

Published in: Surface Science
Published: 2007
URI: https://cronfa.swan.ac.uk/Record/cronfa1855
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first_indexed 2013-07-23T11:48:39Z
last_indexed 2018-02-09T04:29:31Z
id cronfa1855
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fullrecord <?xml version="1.0"?><rfc1807><datestamp>2011-10-01T00:00:00.0000000</datestamp><bib-version>v2</bib-version><id>1855</id><entry>2011-10-01</entry><title>STM and XPS characterisation of vacuum annealed nanocrystalline WO3 films</title><swanseaauthors><author><sid>2ce7e1dd9006164425415a35fa452494</sid><ORCID>0000-0003-4833-8492</ORCID><firstname>Richard</firstname><surname>Cobley</surname><name>Richard Cobley</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2011-10-01</date><deptcode>EEEG</deptcode><abstract></abstract><type>Journal Article</type><journal>Surface Science</journal><volume>604</volume><journalNumber></journalNumber><paginationStart>4953</paginationStart><paginationEnd/><publisher/><placeOfPublication/><issnPrint/><issnElectronic/><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2007</publishedYear><publishedDate>2007-12-31</publishedDate><doi>10.1016/j.susc.2007.08.009</doi><url/><notes/><college>COLLEGE NANME</college><department>Electronic and Electrical Engineering</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>EEEG</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2011-10-01T00:00:00.0000000</lastEdited><Created>2011-10-01T00:00:00.0000000</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering</level></path><authors><author><firstname>T.G.G</firstname><surname>Maffeis</surname><order>1</order></author><author><firstname>D</firstname><surname>Yung</surname><order>2</order></author><author><firstname>L</firstname><surname>LePennec</surname><order>3</order></author><author><firstname>M.W</firstname><surname>Penny</surname><order>4</order></author><author><firstname>R.J</firstname><surname>Cobley</surname><order>5</order></author><author><firstname>E</firstname><surname>Comini</surname><order>6</order></author><author><firstname>G</firstname><surname>Sberveglieri</surname><order>7</order></author><author><firstname>S.P</firstname><surname>Wilks</surname><order>8</order></author><author><firstname>Richard</firstname><surname>Cobley</surname><orcid>0000-0003-4833-8492</orcid><order>9</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2011-10-01T00:00:00.0000000 v2 1855 2011-10-01 STM and XPS characterisation of vacuum annealed nanocrystalline WO3 films 2ce7e1dd9006164425415a35fa452494 0000-0003-4833-8492 Richard Cobley Richard Cobley true false 2011-10-01 EEEG Journal Article Surface Science 604 4953 31 12 2007 2007-12-31 10.1016/j.susc.2007.08.009 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2011-10-01T00:00:00.0000000 2011-10-01T00:00:00.0000000 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering T.G.G Maffeis 1 D Yung 2 L LePennec 3 M.W Penny 4 R.J Cobley 5 E Comini 6 G Sberveglieri 7 S.P Wilks 8 Richard Cobley 0000-0003-4833-8492 9
title STM and XPS characterisation of vacuum annealed nanocrystalline WO3 films
spellingShingle STM and XPS characterisation of vacuum annealed nanocrystalline WO3 films
Richard Cobley
title_short STM and XPS characterisation of vacuum annealed nanocrystalline WO3 films
title_full STM and XPS characterisation of vacuum annealed nanocrystalline WO3 films
title_fullStr STM and XPS characterisation of vacuum annealed nanocrystalline WO3 films
title_full_unstemmed STM and XPS characterisation of vacuum annealed nanocrystalline WO3 films
title_sort STM and XPS characterisation of vacuum annealed nanocrystalline WO3 films
author_id_str_mv 2ce7e1dd9006164425415a35fa452494
author_id_fullname_str_mv 2ce7e1dd9006164425415a35fa452494_***_Richard Cobley
author Richard Cobley
author2 T.G.G Maffeis
D Yung
L LePennec
M.W Penny
R.J Cobley
E Comini
G Sberveglieri
S.P Wilks
Richard Cobley
format Journal article
container_title Surface Science
container_volume 604
container_start_page 4953
publishDate 2007
institution Swansea University
doi_str_mv 10.1016/j.susc.2007.08.009
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
document_store_str 0
active_str 0
published_date 2007-12-31T03:04:47Z
_version_ 1763749592972656640
score 11.013148

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