Journal article 1177 views
XPS Characterisation of Vacuum Annealed Nanocrystalline WO3 Films
T. G. G. Maffeis,
M. W. Penny,
R. J. Cobley,
E. Comini,
G. Sberveglieri,
S. P. Wilks,
Steve Wilks,
Thierry Maffeis ,
Richard Cobley
e-Journal of Surface Science and Nanotechnology, Volume: 7, Pages: 319 - 322
Swansea University Authors: Steve Wilks, Thierry Maffeis , Richard Cobley
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DOI (Published version): 10.1380/ejssnt.2009.319
Abstract
XPS Characterisation of Vacuum Annealed Nanocrystalline WO3 Films
Published in: | e-Journal of Surface Science and Nanotechnology |
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ISBN: | N/A |
ISSN: | 1348-0391 |
Published: |
2009
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Online Access: |
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URI: | https://cronfa.swan.ac.uk/Record/cronfa5568 |
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College: |
Faculty of Science and Engineering |
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Start Page: |
319 |
End Page: |
322 |