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XPS Characterisation of Vacuum Annealed Nanocrystalline WO3 Films

T. G. G. Maffeis, M. W. Penny, R. J. Cobley, E. Comini, G. Sberveglieri, S. P. Wilks, Steve Wilks, Thierry Maffeis Orcid Logo, Richard Cobley Orcid Logo

e-Journal of Surface Science and Nanotechnology, Volume: 7, Pages: 319 - 322

Swansea University Authors: Steve Wilks, Thierry Maffeis Orcid Logo, Richard Cobley Orcid Logo

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Published in: e-Journal of Surface Science and Nanotechnology
ISBN: N/A
ISSN: 1348-0391
Published: 2009
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa5568
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College: Faculty of Science and Engineering
Start Page: 319
End Page: 322