Journal article 982 views
Impurity-induced disordering in AlGaInP superlattices studied using cross-sectional scanning tunneling microscopy
K. S Teng,
M. R Brown,
S. P Wilks,
A Sobiesierski,
P. M Smowton,
P Blood,
Vincent Teng 
,
Rowan Brown
,
Rowan Brown
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Volume: 22, Issue: 4, Start page: 2014
Swansea University Authors:
Vincent Teng , Rowan Brown
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1116/1.1768187
Abstract
Impurity-induced disordering in AlGaInP superlattices studied using cross-sectional scanning tunneling microscopy
| Published in: | Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures |
|---|---|
| ISSN: | 0734-211X |
| Published: |
2004
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa12724 |
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| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
4 |
| Start Page: |
2014 |