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Dielectric property measurement of a SiCf/SiC ceramic matrix composite via microwave cavity characterisation

JORDAN STEPHEN, Spencer Jeffs Orcid Logo, Heungjae Choi, Adrian Porch

Open Ceramics, Volume: 23, Start page: 100818

Swansea University Authors: JORDAN STEPHEN, Spencer Jeffs Orcid Logo

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DOI (Published version): 10.1016/j.oceram.2025.100818

Abstract

Ceramic Matrix Composites (CMCs) are used for high temperature structural engineering applications, such as those found within gas turbine engines. When operating in these environments they can undergo oxidation and damage that may not be easily detectable, emphasising the need for a non-invasive as...

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Published in: Open Ceramics
ISSN: 2666-5395
Published: Elsevier BV 2025
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URI: https://cronfa.swan.ac.uk/Record/cronfa69935
first_indexed 2025-07-10T10:16:54Z
last_indexed 2025-09-05T06:12:11Z
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spelling 2025-09-04T11:32:52.4536790 v2 69935 2025-07-10 Dielectric property measurement of a SiCf/SiC ceramic matrix composite via microwave cavity characterisation d1539257433a23615c21f80023ad8acd JORDAN STEPHEN JORDAN STEPHEN true false 6ff76d567df079d8bf299990849c3d8f 0000-0002-2819-9651 Spencer Jeffs Spencer Jeffs true false 2025-07-10 Ceramic Matrix Composites (CMCs) are used for high temperature structural engineering applications, such as those found within gas turbine engines. When operating in these environments they can undergo oxidation and damage that may not be easily detectable, emphasising the need for a non-invasive assessment approach that could detect such changes. In this research, we use a single mode microwave cavity for sensitive dielectric property measurement as a method of assessment for Silicon Carbide (SiC) CMC material. We have also used this method to characterise individual bundles of SiC fibres, to develop an understanding of the method. Environmental conditions are then applied to the CMC samples including a high temperature exposure at 800 °C, and humidity exposures followed by two different 800 °C reheat durations. Characterisation was performed on the pre- and post-exposed material to verify the severity of each exposure, both microstructurally and mechanically, to compare these with microwave dielectric property data. Journal Article Open Ceramics 23 100818 Elsevier BV 2666-5395 Ceramic matrix composites; Dielectric properties; Microwave cavity characterisation 1 9 2025 2025-09-01 10.1016/j.oceram.2025.100818 COLLEGE NANME COLLEGE CODE Swansea University External research funder(s) paid the OA fee (includes OA grants disbursed by the Library) The current research was funded under the EPSRC Industrial Case Award EP/T517537/1. 2025-09-04T11:32:52.4536790 2025-07-10T11:14:17.3733853 Faculty of Science and Engineering School of Engineering and Applied Sciences - Materials Science and Engineering JORDAN STEPHEN 1 Spencer Jeffs 0000-0002-2819-9651 2 Heungjae Choi 3 Adrian Porch 4 69935__34721__6071c23dcdf349d685105ef58695c29a.pdf 69935.VoR.pdf 2025-07-10T11:19:40.1671695 Output 14912997 application/pdf Version of Record true © 2025 The Authors. This is an open access article under the CC BY license. true eng https://doi.org/10.1016/j.oceram.2025.100818
title Dielectric property measurement of a SiCf/SiC ceramic matrix composite via microwave cavity characterisation
spellingShingle Dielectric property measurement of a SiCf/SiC ceramic matrix composite via microwave cavity characterisation
JORDAN STEPHEN
Spencer Jeffs
title_short Dielectric property measurement of a SiCf/SiC ceramic matrix composite via microwave cavity characterisation
title_full Dielectric property measurement of a SiCf/SiC ceramic matrix composite via microwave cavity characterisation
title_fullStr Dielectric property measurement of a SiCf/SiC ceramic matrix composite via microwave cavity characterisation
title_full_unstemmed Dielectric property measurement of a SiCf/SiC ceramic matrix composite via microwave cavity characterisation
title_sort Dielectric property measurement of a SiCf/SiC ceramic matrix composite via microwave cavity characterisation
author_id_str_mv d1539257433a23615c21f80023ad8acd
6ff76d567df079d8bf299990849c3d8f
author_id_fullname_str_mv d1539257433a23615c21f80023ad8acd_***_JORDAN STEPHEN
6ff76d567df079d8bf299990849c3d8f_***_Spencer Jeffs
author JORDAN STEPHEN
Spencer Jeffs
author2 JORDAN STEPHEN
Spencer Jeffs
Heungjae Choi
Adrian Porch
format Journal article
container_title Open Ceramics
container_volume 23
container_start_page 100818
publishDate 2025
institution Swansea University
issn 2666-5395
doi_str_mv 10.1016/j.oceram.2025.100818
publisher Elsevier BV
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Materials Science and Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Materials Science and Engineering
document_store_str 1
active_str 0
description Ceramic Matrix Composites (CMCs) are used for high temperature structural engineering applications, such as those found within gas turbine engines. When operating in these environments they can undergo oxidation and damage that may not be easily detectable, emphasising the need for a non-invasive assessment approach that could detect such changes. In this research, we use a single mode microwave cavity for sensitive dielectric property measurement as a method of assessment for Silicon Carbide (SiC) CMC material. We have also used this method to characterise individual bundles of SiC fibres, to develop an understanding of the method. Environmental conditions are then applied to the CMC samples including a high temperature exposure at 800 °C, and humidity exposures followed by two different 800 °C reheat durations. Characterisation was performed on the pre- and post-exposed material to verify the severity of each exposure, both microstructurally and mechanically, to compare these with microwave dielectric property data.
published_date 2025-09-01T05:31:08Z
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