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Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential Technology

Adam Jones Orcid Logo, Leshan Uggalla Orcid Logo, Kang Li Orcid Logo, Yuanlong Fan Orcid Logo, Ashley Willow Orcid Logo, Christopher Mills, Nigel Copner

Sensors, Volume: 21, Issue: 10, Start page: 3340

Swansea University Authors: Ashley Willow Orcid Logo, Christopher Mills

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DOI (Published version): 10.3390/s21103340

Abstract

Coatings or films are applied to a substrate for several applications, such as waterproofing, corrosion resistance, adhesion performance, cosmetic effects, and optical coatings. When applying a coating to a substrate, it is vital to monitor the coating thickness during the coating process to achieve...

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Published in: Sensors
ISSN: 1424-8220
Published: MDPI AG 2021
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URI: https://cronfa.swan.ac.uk/Record/cronfa68489
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spelling 2025-01-30T15:34:27.7153911 v2 68489 2024-12-09 Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential Technology 4cb7d3eb9775e2a5e2920db4b8954681 0000-0001-9355-4712 Ashley Willow Ashley Willow true false 044892cbbf985e70769fc56e973357a7 Christopher Mills Christopher Mills true false 2024-12-09 EAAS Coatings or films are applied to a substrate for several applications, such as waterproofing, corrosion resistance, adhesion performance, cosmetic effects, and optical coatings. When applying a coating to a substrate, it is vital to monitor the coating thickness during the coating process to achieve a product to the desired specification via real time production control. There are several different coating thickness measurement methods that can be used, either in-line or off-line, which can determine the coating thickness relative to the material of the coating and the substrate. In-line coating thickness measurement methods are often very difficult to design and implement due to the nature of the harsh environmental conditions of typical production processes and the speed at which the process is run. This paper addresses the current and novel coating thickness methodologies for application to chromium coatings on a ferro-magnetic steel substrate with their advantages and limitations regarding in-line measurement. The most common in-line coating thickness measurement method utilized within the steel packaging industry is the X-ray Fluorescence (XRF) method, but these systems can become costly when implemented for a wide packaging product and pose health and safety concerns due to its ionizing radiation. As technology advances, nanometer-scale coatings are becoming more common, and here three methods are highlighted, which have been used extensively in other industries (with several variants in their design) which can potentially measure coatings of nanometer thickness in a production line, precisely, safely, and do so in a non-contact and non-destructive manner. These methods are optical reflectometry, ellipsometry and interferometry. Journal Article Sensors 21 10 3340 MDPI AG 1424-8220 coating thickness measurement; chromium; steel substrate; optical metrology 11 5 2021 2021-05-11 10.3390/s21103340 COLLEGE NANME Engineering and Applied Sciences School COLLEGE CODE EAAS Swansea University Other Knowledge Economy Skills Scholarships (KESS) is a pan-Wales higher-level skills initiative led by Bangor University on behalf of the HE sectors in Wales. It is part funded by the Welsh Government’s European Social Fund (ESF) program for East Wales. 2025-01-30T15:34:27.7153911 2024-12-09T12:43:07.8038456 Faculty of Science and Engineering School of Engineering and Applied Sciences - Chemical Engineering Adam Jones 0000-0003-2102-2279 1 Leshan Uggalla 0000-0001-9835-9967 2 Kang Li 0000-0002-2306-4037 3 Yuanlong Fan 0000-0001-8914-4796 4 Ashley Willow 0000-0001-9355-4712 5 Christopher Mills 6 Nigel Copner 7 68489__33451__f095516db1c34bf98a872d27adc69dd9.pdf 68489.VoR.pdf 2025-01-30T15:33:09.8950011 Output 12304940 application/pdf Version of Record true © 2021 by the authors. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license. true eng https://creativecommons.org/licenses/by/4.0/
title Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential Technology
spellingShingle Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential Technology
Ashley Willow
Christopher Mills
title_short Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential Technology
title_full Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential Technology
title_fullStr Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential Technology
title_full_unstemmed Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential Technology
title_sort Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential Technology
author_id_str_mv 4cb7d3eb9775e2a5e2920db4b8954681
044892cbbf985e70769fc56e973357a7
author_id_fullname_str_mv 4cb7d3eb9775e2a5e2920db4b8954681_***_Ashley Willow
044892cbbf985e70769fc56e973357a7_***_Christopher Mills
author Ashley Willow
Christopher Mills
author2 Adam Jones
Leshan Uggalla
Kang Li
Yuanlong Fan
Ashley Willow
Christopher Mills
Nigel Copner
format Journal article
container_title Sensors
container_volume 21
container_issue 10
container_start_page 3340
publishDate 2021
institution Swansea University
issn 1424-8220
doi_str_mv 10.3390/s21103340
publisher MDPI AG
college_str Faculty of Science and Engineering
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hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Chemical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Chemical Engineering
document_store_str 1
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description Coatings or films are applied to a substrate for several applications, such as waterproofing, corrosion resistance, adhesion performance, cosmetic effects, and optical coatings. When applying a coating to a substrate, it is vital to monitor the coating thickness during the coating process to achieve a product to the desired specification via real time production control. There are several different coating thickness measurement methods that can be used, either in-line or off-line, which can determine the coating thickness relative to the material of the coating and the substrate. In-line coating thickness measurement methods are often very difficult to design and implement due to the nature of the harsh environmental conditions of typical production processes and the speed at which the process is run. This paper addresses the current and novel coating thickness methodologies for application to chromium coatings on a ferro-magnetic steel substrate with their advantages and limitations regarding in-line measurement. The most common in-line coating thickness measurement method utilized within the steel packaging industry is the X-ray Fluorescence (XRF) method, but these systems can become costly when implemented for a wide packaging product and pose health and safety concerns due to its ionizing radiation. As technology advances, nanometer-scale coatings are becoming more common, and here three methods are highlighted, which have been used extensively in other industries (with several variants in their design) which can potentially measure coatings of nanometer thickness in a production line, precisely, safely, and do so in a non-contact and non-destructive manner. These methods are optical reflectometry, ellipsometry and interferometry.
published_date 2021-05-11T09:38:51Z
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score 11.060726

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