No Cover Image

Journal article 110 views 30 downloads

Exciton diffusion in organic semiconductors: precision and pitfalls

Drew Riley Orcid Logo, Paul Meredith Orcid Logo, Ardalan Armin

Nanoscale, Volume: 16, Issue: 38, Pages: 17761 - 17777

Swansea University Authors: Drew Riley Orcid Logo, Paul Meredith Orcid Logo, Ardalan Armin

  • D4NR02467B.pdf

    PDF | Version of Record

    Distributed under the terms of a Creative Commons CC-BY licence.

    Download (2.77MB)

Check full text

DOI (Published version): 10.1039/d4nr02467b

Abstract

Nanometer exciton diffusion is a fundamental process important in virtually all applications of organic semiconductors. Many measurement techniques have been developed to measure exciton diffusion length (LD) at the nanometer scale; however, these techniques have common challenges that the community...

Full description

Published in: Nanoscale
ISSN: 2040-3364 2040-3372
Published: Royal Society of Chemistry (RSC) 2024
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa67452
first_indexed 2024-08-23T09:37:57Z
last_indexed 2024-11-27T19:44:55Z
id cronfa67452
recordtype SURis
fullrecord <?xml version="1.0"?><rfc1807><datestamp>2024-11-27T16:26:37.1324997</datestamp><bib-version>v2</bib-version><id>67452</id><entry>2024-08-23</entry><title>Exciton diffusion in organic semiconductors: precision and pitfalls</title><swanseaauthors><author><sid>edca1c48f922393fa2b3cb84d8dc0e4a</sid><ORCID>0000-0001-6688-0694</ORCID><firstname>Drew</firstname><surname>Riley</surname><name>Drew Riley</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>31e8fe57fa180d418afd48c3af280c2e</sid><ORCID>0000-0002-9049-7414</ORCID><firstname>Paul</firstname><surname>Meredith</surname><name>Paul Meredith</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>22b270622d739d81e131bec7a819e2fd</sid><firstname>Ardalan</firstname><surname>Armin</surname><name>Ardalan Armin</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2024-08-23</date><deptcode>BGPS</deptcode><abstract>Nanometer exciton diffusion is a fundamental process important in virtually all applications of organic semiconductors. Many measurement techniques have been developed to measure exciton diffusion length (LD) at the nanometer scale; however, these techniques have common challenges that the community has worked for decades to overcome. In this perspective, we lay out the principal challenges researchers need to overcome to obtain an accurate measurement of LD. We then examine the most common techniques used to measure LD with respect to these challenges and describe solutions developed to overcome them. This analysis leads to the suggestion that static quenching techniques underestimate LD due to uncertainties in the quenching behavior, while time-resolved exciton&#x2013;exciton annihilation (EEA) techniques overestimate LD based on experimental conditions, we advance steady-state EEA techniques as an alternative that overcome many of the challenges of these other techniques while preserving accuracy. We support this hypothesis with a meta-analysis of LD measured across various organic semiconductors and measurement techniques. We intend this investigation to provide a framework for researchers to interpret and compare findings across measurement techniques and to guide researchers on how to obtain the most accurate results for each technique in question.</abstract><type>Journal Article</type><journal>Nanoscale</journal><volume>16</volume><journalNumber>38</journalNumber><paginationStart>17761</paginationStart><paginationEnd>17777</paginationEnd><publisher>Royal Society of Chemistry (RSC)</publisher><placeOfPublication/><isbnPrint/><isbnElectronic/><issnPrint>2040-3364</issnPrint><issnElectronic>2040-3372</issnElectronic><keywords>Organic semiconductors</keywords><publishedDay>13</publishedDay><publishedMonth>8</publishedMonth><publishedYear>2024</publishedYear><publishedDate>2024-08-13</publishedDate><doi>10.1039/d4nr02467b</doi><url/><notes>Mini Review</notes><college>COLLEGE NANME</college><department>Biosciences Geography and Physics School</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>BGPS</DepartmentCode><institution>Swansea University</institution><apcterm>SU Library paid the OA fee (TA Institutional Deal)</apcterm><funders>European Regional Development Fund Grant: Unassigned Identifier: doi https://doi.org/10.13039/501100008530 Swansea University Grant: Unassigned Identifier: doi https://doi.org/10.13039/501100001317 Engineering and Physical Sciences Research Council Grant: EP/T028513/1 Identifier: doi https://doi.org/10.13039/501100000266</funders><projectreference/><lastEdited>2024-11-27T16:26:37.1324997</lastEdited><Created>2024-08-23T10:20:34.4294325</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Biosciences, Geography and Physics - Physics</level></path><authors><author><firstname>Drew</firstname><surname>Riley</surname><orcid>0000-0001-6688-0694</orcid><order>1</order></author><author><firstname>Paul</firstname><surname>Meredith</surname><orcid>0000-0002-9049-7414</orcid><order>2</order></author><author><firstname>Ardalan</firstname><surname>Armin</surname><order>3</order></author></authors><documents><document><filename>67452__31158__91e6a1e4dc38491ea2c0e68567b727e5.pdf</filename><originalFilename>D4NR02467B.pdf</originalFilename><uploaded>2024-08-23T10:20:34.4291409</uploaded><type>Output</type><contentLength>2905518</contentLength><contentType>application/pdf</contentType><version>Version of Record</version><cronfaStatus>true</cronfaStatus><documentNotes>Distributed under the terms of a Creative Commons CC-BY licence.</documentNotes><copyrightCorrect>true</copyrightCorrect><language>eng</language><licence>https://creativecommons.org/licenses/by/3.0/</licence></document></documents><OutputDurs/></rfc1807>
spelling 2024-11-27T16:26:37.1324997 v2 67452 2024-08-23 Exciton diffusion in organic semiconductors: precision and pitfalls edca1c48f922393fa2b3cb84d8dc0e4a 0000-0001-6688-0694 Drew Riley Drew Riley true false 31e8fe57fa180d418afd48c3af280c2e 0000-0002-9049-7414 Paul Meredith Paul Meredith true false 22b270622d739d81e131bec7a819e2fd Ardalan Armin Ardalan Armin true false 2024-08-23 BGPS Nanometer exciton diffusion is a fundamental process important in virtually all applications of organic semiconductors. Many measurement techniques have been developed to measure exciton diffusion length (LD) at the nanometer scale; however, these techniques have common challenges that the community has worked for decades to overcome. In this perspective, we lay out the principal challenges researchers need to overcome to obtain an accurate measurement of LD. We then examine the most common techniques used to measure LD with respect to these challenges and describe solutions developed to overcome them. This analysis leads to the suggestion that static quenching techniques underestimate LD due to uncertainties in the quenching behavior, while time-resolved exciton–exciton annihilation (EEA) techniques overestimate LD based on experimental conditions, we advance steady-state EEA techniques as an alternative that overcome many of the challenges of these other techniques while preserving accuracy. We support this hypothesis with a meta-analysis of LD measured across various organic semiconductors and measurement techniques. We intend this investigation to provide a framework for researchers to interpret and compare findings across measurement techniques and to guide researchers on how to obtain the most accurate results for each technique in question. Journal Article Nanoscale 16 38 17761 17777 Royal Society of Chemistry (RSC) 2040-3364 2040-3372 Organic semiconductors 13 8 2024 2024-08-13 10.1039/d4nr02467b Mini Review COLLEGE NANME Biosciences Geography and Physics School COLLEGE CODE BGPS Swansea University SU Library paid the OA fee (TA Institutional Deal) European Regional Development Fund Grant: Unassigned Identifier: doi https://doi.org/10.13039/501100008530 Swansea University Grant: Unassigned Identifier: doi https://doi.org/10.13039/501100001317 Engineering and Physical Sciences Research Council Grant: EP/T028513/1 Identifier: doi https://doi.org/10.13039/501100000266 2024-11-27T16:26:37.1324997 2024-08-23T10:20:34.4294325 Faculty of Science and Engineering School of Biosciences, Geography and Physics - Physics Drew Riley 0000-0001-6688-0694 1 Paul Meredith 0000-0002-9049-7414 2 Ardalan Armin 3 67452__31158__91e6a1e4dc38491ea2c0e68567b727e5.pdf D4NR02467B.pdf 2024-08-23T10:20:34.4291409 Output 2905518 application/pdf Version of Record true Distributed under the terms of a Creative Commons CC-BY licence. true eng https://creativecommons.org/licenses/by/3.0/
title Exciton diffusion in organic semiconductors: precision and pitfalls
spellingShingle Exciton diffusion in organic semiconductors: precision and pitfalls
Drew Riley
Paul Meredith
Ardalan Armin
title_short Exciton diffusion in organic semiconductors: precision and pitfalls
title_full Exciton diffusion in organic semiconductors: precision and pitfalls
title_fullStr Exciton diffusion in organic semiconductors: precision and pitfalls
title_full_unstemmed Exciton diffusion in organic semiconductors: precision and pitfalls
title_sort Exciton diffusion in organic semiconductors: precision and pitfalls
author_id_str_mv edca1c48f922393fa2b3cb84d8dc0e4a
31e8fe57fa180d418afd48c3af280c2e
22b270622d739d81e131bec7a819e2fd
author_id_fullname_str_mv edca1c48f922393fa2b3cb84d8dc0e4a_***_Drew Riley
31e8fe57fa180d418afd48c3af280c2e_***_Paul Meredith
22b270622d739d81e131bec7a819e2fd_***_Ardalan Armin
author Drew Riley
Paul Meredith
Ardalan Armin
author2 Drew Riley
Paul Meredith
Ardalan Armin
format Journal article
container_title Nanoscale
container_volume 16
container_issue 38
container_start_page 17761
publishDate 2024
institution Swansea University
issn 2040-3364
2040-3372
doi_str_mv 10.1039/d4nr02467b
publisher Royal Society of Chemistry (RSC)
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Biosciences, Geography and Physics - Physics{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Biosciences, Geography and Physics - Physics
document_store_str 1
active_str 0
description Nanometer exciton diffusion is a fundamental process important in virtually all applications of organic semiconductors. Many measurement techniques have been developed to measure exciton diffusion length (LD) at the nanometer scale; however, these techniques have common challenges that the community has worked for decades to overcome. In this perspective, we lay out the principal challenges researchers need to overcome to obtain an accurate measurement of LD. We then examine the most common techniques used to measure LD with respect to these challenges and describe solutions developed to overcome them. This analysis leads to the suggestion that static quenching techniques underestimate LD due to uncertainties in the quenching behavior, while time-resolved exciton–exciton annihilation (EEA) techniques overestimate LD based on experimental conditions, we advance steady-state EEA techniques as an alternative that overcome many of the challenges of these other techniques while preserving accuracy. We support this hypothesis with a meta-analysis of LD measured across various organic semiconductors and measurement techniques. We intend this investigation to provide a framework for researchers to interpret and compare findings across measurement techniques and to guide researchers on how to obtain the most accurate results for each technique in question.
published_date 2024-08-13T02:51:46Z
_version_ 1821372219213742080
score 11.04748

Similar Items